Single crystalline tungsten nanowires were prepared from directionally solidified NiAl-W alloys by a chemical release from the resulting binary phase material. Electron back scatter diffraction (EBSD) proves that they are single crystals having identical crystallographic orientation. Mechanical investigations such as bending tests, lateral force measurements, and mechanical resonance measurements were performed on 100–300 nm diameter wires. The wires could be either directly employed using micro tweezers, as a singly clamped nanowire or in a doubly clamped nanobridge. The mechanical tests exhibit a surprisingly high flexibility for such a brittle material resulting from the small dimensions. Force displacement measurements on singly clamped W nanowires by an AFM measurement allowed the determination of a Young's modulus of 332 GPa very close to the bulk value of 355 GPa. Doubly clamped W nanowires were employed as resonant oscillating nanowires in a magnetomotively driven resonator running at 117 kHz. The Young's modulus determined from this setup was found to be higher 450 GPa which is likely to be an artefact resulting from the shift of the resonance frequency by an additional mass loading.

There is a high demand for compact low-cost ozone sensors. It has been shown recently that In2O3 nanolayers can act as ozone sensitive films activated at room temperature by ultraviolet light. In the present work, the authors integrate ultrathin layers of In2O3 nanoparticles and a GaInN∕GaN based blue light emitting diode (LED) on a single sensor chip. The integrated sensor was found to be sensitive to O3 concentrations as low as ∼40ppb. These results demonstrate that by integrating GaInN∕GaN based blue LEDs and metal oxide sensing layers back to back on a single chip, compact and robust gas sensors can be realized.

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One-step device fabrication through the integration of nanowires (NWs) into silicon microchips is still under intensive scientific study as it has proved difficult to obtain a reliable and controllable fabrication technique. So far, the techniques are either costly or suffer from small throughput. Recently, a cost-effective method based on thin-film fracture that can be used as a template for NW fabrication was suggested. Here, a way to integrate NWs between microcontacts is demonstrated. Different geometries of microstructured photoresist formed by using standard photolithography are analyzed. Surprisingly, a very simple "stripe" geometry is found to yield highly reproducible fracture patterns, which are convenient templates for fault-tolerant NW fabrication. Microchips containing integrated Au, Pd, Ni, and Ti NWs and their suitability for studies of conductivity and oxidation behavior are reported, and their suitability as a hydrogen sensor is investigated. Details of the fabrication process are also discussed.

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The elastic properties of metallic and semiconducting nanowires were analyzed by different techniques employing static and dynamic loads. The reliability of the methods is verified by analyzing well defined microstructures and a good agreement for the values of the Young's modulus determined by the different methods was achieved. For the investigated materials systems (Au, W, Si, InN), basically no differences in the Young's moduli were observed between microstructures, bulk material, and nanowires with radii of 20-300 nm. Microstructure, morphological undulation, defects, and contaminations,however, can drastically change the apparent Young's moduli of nanowires. Examples are given, where an apparent increasing or decreasing of the Young's modulus with decreasing diameter is caused by such effects. The same effects have also influence on the fracture strength in nanowires. While perfect Au nanowires exhibit fracture strengths exceeding the bulk values up to two orders of magnitude, any anomaly causes earlier failure. In addition, failure mechanisms are observed to be dependent on themicrostructure. While single crystallineAu nanowires have shown a pure elastic deformation upon load, polycrystalline nanowires show a remarkable plastic deformation before breaking

In 2 O 3 nanoparticles were synthesized at low substrate temperatures by the metal organic chemical vapor deposition technique. Nanoparticles with a mean diameter from 3 to 33 nm can be obtained by varying the growth temperature. Photoreduction and oxidation studies were carried out for particle-containing layers exhibiting a resistance change of more than five orders of magnitude after ultraviolet irradiation and oxidation by ozone. A grain boundary model was proposed to understand the photoreduction and oxidation mechanism for the nanoparticle layers. It was suggested that by photoreduction the nanoparticles are reactivated throughout the layer. The Schottky barrier between the nanoparticles decreases inducing a reduction of the space-charge-limited region. After oxidation, a completely depleted space-charge region covering the whole volume of In2O3 nanoparticles is formed. Furthermore, the bulk diffusion process dominates the response of thick layers during the oxidation process. By decreasing the layer thickness down to 10 nm, surface effects dominate, resulting in an ultrafast response to changes in ozone concentration. The typical response time of very thin In2O3 nanoparticle layers was determined to be less than 1 s.

In this work, we report on the epitaxial growth of high-quality cubic indium oxide thick films on c-plane sapphire substrates using a two-step growth process. The epitaxial relationship of In2O3 on (0001) Al2O3 has been investigated. The (222) plane spacing and lattice parameter of a most strain-relaxed high-quality In2O3 film have been determined to be 292.58 pm and 1013.53 pm, respectively. The electronic properties in dependence of the film thickness are interpreted using a three-region model. The density at the surface and interface totals (3.3±1.5)×1013cm-2, while the background electron density in the bulk was determined to be (2.4±0.5)×1018cm-3. Furthermore, post treatments such as irradiation via ultraviolet light and ozone oxidation have been found to influence only the surface layer, while the bulk electronic properties remain unchanged.