No abstract

With ever-more demanding requirements for the accurate manufacture of large components, dimensional measuring techniques are becoming progressively more sophisticated. This review describes some of the more recently developed techniques and the state-of-the-art in the more well-known large-scale dimensional metrology methods. In some cases, the techniques are described in detail, or, where relevant specialist review papers exist, these are cited as further reading. The traceability of the measurement data collected is discussed with reference to new international standards that are emerging. In some cases, hybrid measurement techniques are finding specialized applications and these are referred to where appropriate.

No abstract

No abstract

No abstract

Small and unintended offsets, tilts, and eccentricity of the mechanical and optical components in laser trackers introduce systematic errors in the measured spherical coordinates (angles and range readings) and possibly in the calculated lengths of reference artifacts. It is desirable that the tests described in the ASME B89.4.19 Standard [1] be sensitive to these geometric misalignments so that any resulting systematic errors are identified during performance evaluation. In this paper, we present some analysis, using error models and numerical simulation, of the sensitivity of the length measurement system tests and two-face system tests in the B89.4.19 Standard to misalignments in laser trackers. We highlight key attributes of the testing strategy adopted in the Standard and propose new length measurement system tests that demonstrate improved sensitivity to some misalignments. Experimental results with a tracker that is not properly error corrected for the effects of the misalignments validate claims regarding the proposed new length tests.

Traditional surface texture analysis involves filtering surface profiles into different wavelength bands commonly referred to as roughness, waviness and form. The primary motivation in filtering surface profiles is to map each band to the manufacturing process that generated the part and the intended functional performance of the component. Current trends in manufacturing are towards tighter tolerances and higher performance standards that require close monitoring of the process. Thus, there is a need for finer bandwidths for process mapping and functional correlation. Wavelets are becoming increasingly popular tools for filtering profiles in an efficient manner into multiple bands. While they have broadly been demonstrated as having superior performance and capabilities than traditional filtering, fundamental issues such as choice of wavelet bases have remained unaddressed. The major contribution of this paper is to present the differences between wavelets in terms of the transmission characteristics of the associated filter banks, which is essential for surface analysis. This paper also reviews fundamental mathematics of wavelet theory necessary for applying wavelets to surface texture analysis. Wavelets from two basic categories-orthogonal wavelet bases and biorthogonal wavelet bases are studied. The filter banks corresponding to the wavelets are compared and multiresolution analysis on surface profiles is performed to highlight the applicability of this technique.

No abstract