With ever-more demanding requirements for the accurate manufacture of large components, dimensional measuring techniques are becoming progressively more sophisticated. This review describes some of the more recently developed techniques and the state-of-the-art in the more well-known large-scale dimensional metrology methods. In some cases, the techniques are described in detail, or, where relevant specialist review papers exist, these are cited as further reading. The traceability of the measurement data collected is discussed with reference to new international standards that are emerging. In some cases, hybrid measurement techniques are finding specialized applications and these are referred to where appropriate.
We report on a fast, easily implemented method to determine all the geometrical alignment errors of a laser tracker, to high precision. The technique requires no specialist equipment and can be performed in less than an hour. The technique is based on the determination of parameters of a geometric model of the laser tracker, using measurements of a set of fixed target locations, from multiple locations of the tracker. After fitting of the model parameters to the observed data, the model can be used to perform error correction of the raw laser tracker data or to derive correction parameters in the format of the tracker manufacturer's internal error map. In addition to determination of the model parameters, the method also determines the uncertainties and correlations associated with the parameters. We have tested the technique on a commercial laser tracker in the following way. We disabled the tracker's internal error compensation, and used a five-position, fifteen-target network to estimate all the geometric errors of the instrument. Using the error map generated from this network test, the tracker was able to pass a full performance validation test, conducted according to a recognized specification standard (ASME B89.4.19-2006). We conclude that the error correction determined from the network test is as effective as the manufacturer's own error correction methodologies.
We present an implementation of an absolute distance measurement system which uses frequency scanning interferometry (FSI). The technique, referred to as dynamic FSI, uses two frequency scanning lasers, a gas absorption cell and a reference interferometer to determine the unknown optical path length difference (OPD) of one or many measurement interferometers. The gas absorption cell is the length reference for the measurement system and is traceable to international standards through knowledge of the frequencies of its absorption features. The OPD of the measurement interferometers can vary during the measurement and the variation is measured at the sampling rate of the system (2.77 MHz in the system described here). The system is shown to measure distances from 0.2 m to 20 m with a combined relative uncertainty of 0.41 × 10⁻⁶ at the two sigma level (k = 2). It will be shown that within a scan the change in OPD of the measurement interferometer can be determined to a resolution of 40 nm.
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