GaN-based micro light-emitting diode (μLED) arrays are very promising devices for display applications. In these arrays, each μLED works as a single pixel of a whole image. The electro-optical performance of these μLEDs is an important subject to study. Here, we investigate the influence of LED size on the radiative and non-radiative recombination. The standard ABC model has been widely used to describe the efficiency of GaN based LEDs. Using this model, we extract A, B, and C coefficients for various LED sizes, showing how the competition between radiative and non-radiative recombination processes varies with the LED geometry. Time-resolved photoluminescence allows us to determine coefficient B, related to radiative recombination. Through current-voltage-luminance characterizations, we determine parameters A and C related to Shockley-Read-Hall and Auger recombination. We find that coefficient A is strongly dependent on LED size, indicating a drastic effect of sidewall defects on the performance of LEDs. On the other hand, coefficient C is independent of LED size. This latter result demonstrates that efficiency droop does not depend on LED size.
Contact effects have been investigated in fully printed p-channel organic thin film transistors with field effect mobility up to 2 cm2/Vs. Electrical characteristics of the organic thin film transistors, with channel length <200lm, are seriously influenced by contact effects with an anomalous increase of the contact resistance for increasing source-drain voltage. Assuming that contact effects are negligible in long channel transistors and using gradual channel approximation, we evaluated the current-voltage characteristics of the injection contact, showing that I-V characteristics can be modeled as a reverse biased Schottky diode, including barrier lowering induced by the Schottky effect
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