Ultrathin films of the cofacially stacked F-bridged Al-phthalocyanine polymer, (AlPcF)n , have been grown using the highly controlled technique of molecular beam epitaxy. A parallel orientation of the polymer backbone to the substrate surface occurs in films on silicon and quartz, but epitaxy is not apparent. On single-crystal alkali halide substrates, the backbone is perpendicular to the substrate surface, and an epitaxial relationship exists that is influenced by the interaction between the substrate and phthalocyanine molecule. The transmission electron microscopy studies indicate that the most highly ordered films are produced on KBr(100) and have good continuity and unidirectional crystallite orientation.
Ultrathin films of F-bridged Al-phthalocyanine polymer, (AlPcF)n, grown by the molecular-beam epitaxy technique show unusual spectroscopic properties which can be described by the possibility of pseudomorphic layer formation at the thin-film/substrate interface. A change in the electronic structure of the molecules of this layer is presumed to occur. The existence of the layer is directly related to the degree of epitaxy.
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