Cu 2 ZnSnS 4 films were grown onto FTO/glass substrate by electrodeposition. The influence of sulphurization temperature on CZTS properties was examined using XRD, Raman spectroscopy, SEM, optical transmittance and electrical resistivity measurements. The film sulphurized at 400°C exhibited CuS as the major phase mixed with CZTS and SnS 2 phases. However, the films sulphurized at 450 and 500°C are mainly composed of the CZTS kesterite phase with SnS 2 and CuS as secondary phases. Further sulphurization temperature increase up to 550°C led to the complete disappearance of CuS and SnS 2 phases and the obtained film is a pure CZTS kesterite mono-phase. The Raman spectra exhibit a line centred at 334 cm −1 ; it is the most intense recorded in the spectra of the films sulphurized at 500 and 550°C. The film sulphurized at 550 °C, had an ideal band gap of 1.40 eV and electrical resistivity of (41.4 ± 5.5) Ω cm.
CuInSe 2 thin films were prepared by one-step electrodeposition process using a simplified twoelectrodes system. The films were deposited, during 5, 10, 15 and 20 min, from the deionized water solution consisting of CuCl 2, InCl 3 and SeO 2 onto ITO-coated glass substrates. As-deposited films have been annealed under vacuum at 300 °C during 30 min. The structural, optical band gap and electrical resistivity of elaborated films were studied, respectively, using X-ray diffraction (XRD), Raman spectroscopy, UV spectrophotometer and four-point probe method. The micro structural parameters like lattice constants, crystallite size, dislocation density and strain have been evaluated. The XRD investigation proved that the film deposited at 20 min present CuInSe 2 single phase in its chalcopyrite structure and with preferred orientation along (1 1 2) direction, whereas the films deposited at 5, 10 and 15 min show the CuInSe 2 chalcopyrite structure with the In 2 Se 3 as secondary phase. We have found that the formation mechanism of CuInSe 2 depends on the In 2 Se 3 phase. The optical band gap of the films is found to decrease from 1⋅17 to 1⋅04 eV with increase in deposition time. All films show Raman spectra with a dominant A 1 mode at 174 cm-1 , confirming the chalcopyrite crystalline quality of these films. The films exhibited a range of resistivity varying from 2.3 × 10-3 to 4.4 × 10-1 Ω cm.
In this paper, we report the effect of annealing time on the properties of copper indium diselenide CuInSe 2 films. The CuInSe 2 thin films have been grown at room temperature by electrochemical deposition technique using two electrodes system. The as deposited films were annealed under argon atmosphere at 300 o C during 15, 30, 45 and 60 min. The structural and morphological properties of the resulting films were characterized respectively by means of x-ray diffraction (XRD) and scanning electron microscopy (SEM). The optical band gap was estimated from transmittance measurements. We have found, that after annealing, all films present CuInSe 2 in its chalcopyrite structure and with preferred orientation along <112> direction. The film annealed during 45 min exhibits better crystallinity and excellent optical properties. The SEM pictures show that the elaborated films have a uniform surface morphology with a homogeneity distribution of crystallites, the grain became higher in size with prolongation of annealing time; it lays in the range of 195 to 515Å.
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