2023
DOI: 10.1007/s12034-022-02879-y
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Sulphurization temperature effect on suppressing CuS phase in kesterite CZTS films grown by electrodeposition method

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Cited by 2 publications
(2 citation statements)
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“…Ferdous et al 13 Raman et al used the architecture Al/CdS/Sb 2 Se 3 /Mo and the final PCE they obtained is 28.25%, V oc is 0.86 V, J sc is 37.90 mA/cm 2 , and FF is 86.84% 14 . Daoudi et al have reported PCE of 28.08%, FF of 88%, V oc of 1.07 V, and J sc of 29.53 mA/cm 2 15 . With the structure CZTS/WS2/In2Se3, Kumar Dakua P et al have obtained a PCE of 22.96% 16 .…”
Section: Introductionmentioning
confidence: 99%
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“…Ferdous et al 13 Raman et al used the architecture Al/CdS/Sb 2 Se 3 /Mo and the final PCE they obtained is 28.25%, V oc is 0.86 V, J sc is 37.90 mA/cm 2 , and FF is 86.84% 14 . Daoudi et al have reported PCE of 28.08%, FF of 88%, V oc of 1.07 V, and J sc of 29.53 mA/cm 2 15 . With the structure CZTS/WS2/In2Se3, Kumar Dakua P et al have obtained a PCE of 22.96% 16 .…”
Section: Introductionmentioning
confidence: 99%
“…14 Daoudi et al have reported PCE of 28.08%, FF of 88%, V oc of 1.07 V, and J sc of 29.53 mA/cm 2 . 15 With the structure CZTS/WS2/In2Se3, Kumar Dakua P et al have obtained a PCE of 22.96%. 16 Using Ag2S quantum dot material as a buffer layer for CIGS SCs, Kumar S et al reported PCE of 26.12% and V oc of 1.08 V. 17 Using ZnS as a buffer layer and SnS as a back surface field (BSF) layer, P. Chauhan et al have reported PCE of 18.18%, V oc of 0.78 V, J sc of 27.78 mA/cm 2 , and FF of 83.07%.…”
mentioning
confidence: 99%