2000
DOI: 10.1023/a:1006758119723
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Cited by 4 publications
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“…The focused ion beam ͑FIB͒ technique has been used for the production of various diamond tips, such as single filament push-out probes, 13 high-aspect-ratio AFM tips, 14 and field-emitter tips. 15 FIB sharpening of a diamond nanoindenter tip has also been reported using a specifically designed stage that used H 2 O to enhance removal rate.…”
Section: Introductionmentioning
confidence: 99%
“…The focused ion beam ͑FIB͒ technique has been used for the production of various diamond tips, such as single filament push-out probes, 13 high-aspect-ratio AFM tips, 14 and field-emitter tips. 15 FIB sharpening of a diamond nanoindenter tip has also been reported using a specifically designed stage that used H 2 O to enhance removal rate.…”
Section: Introductionmentioning
confidence: 99%