X-Ray Resonant Magnetic Scattering: Application to Thin Films and Multilayers

Abstract

This paper reports on the use of a new technique to investigate the magnetic properties of thin films, multilayers and artificial structures, the X-ray resonant magnetic scattering at small values of the scattering vector. It can be used either by registering the reflectivity pattern or in a diffraction mode. In comparison with magneto-optical Kerr effect or neutron scattering, it offers an atomic selectivity due to the resonant excitation of a core electron, and even an electronic shell one. Examples are presented mainly in the soft X-range allowing to probe the 3d band of transition metals. They demonstrate the promising possibilities of the method to measure the magnetic moments carried by each of the atomic components in complex systems, as well as their distribution through thin layers, with an atomic resolution.

Soft/MAX - A new Soft X-ray Microscopy and Coherent Imaging Beamline at the MAX IV Facility.

“…The corresponding end-station will be optimized for the studies of magnetic thin films using magnetic dichroism, but is still in the planning stage. Scattering (XRMS [4]) is planned, which will further utilize the variable polarization of the x-rays, and allow us to explore the effects of coherence on these methods. The energy range at SoftiMAX is complimentary to hard x-ray beamlines in this case, as it allows the study of meso-scale structures.…”

Quantifying the thickness of magnetically active layers using x-ray resonant magnetic scattering

“…We follow the treatment of Raoux 11 in measuring XRMS as a function of incident angle. Although total external reflection makes the relationship between probed depth and incident angle nonlinear, magnetic depth profiling may be possible using angularly dependent XRMS.…”