2018
DOI: 10.1017/s143192761801351x
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Soft/MAX - A new Soft X-ray Microscopy and Coherent Imaging Beamline at the MAX IV Facility.

Abstract: SoftiMAX is a new beamline for soft X-ray spectro-microscopy currently under construction at the new MAX IV synchrotron facility in Lund, Sweden. It is situated at the 3 GeV ring at MAX IV, and will provide a very high average coherent flux owing to the low emittance properties of the ring [1]. The SoftiMAX project consists of two branch lines, utilizing different focusing solutions and catering to a variety of imaging methods. As the construction of the beamline is nearing completion, we present the design an… Show more

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Cited by 10 publications
(8 citation statements)
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“…Crystal structure of the as-prepared and annealed particles was evaluated by X-ray diffraction in transmission geometry using Stoe Stadi MP, Mythen 1k detector, Cu-K alpha radiation, λ = 1.54178 Å. Electron microscopy was performed using transmission electron microscopy (TEM) Jeol JEM-3000F, and scanning electron microscopy (SEM), Hitachi-SU8010 Cold Field Emission. To study the magnetic behavior of the structures, they were prepared directly on single crystalline SiO 2 stripes and the measurements were done using a superconducting quantum interference device vibrating sample magnetometer (SQUID-VSM, MPMS 3, Quantum Design), and a commercial vector vibrating sample magnetometer (MicroSense Model 10 VSM) equipped with a rotating electromagnet generating a maximum field of 2 T. The scanning transmission X-ray microscopy measurements were performed at the PolLux beamline 68 of the Swiss Light Source and the SoftiMAX beamline 69,70 of the MAX IV laboratory.…”
Section: Experimental and Simulationsmentioning
confidence: 99%
“…Crystal structure of the as-prepared and annealed particles was evaluated by X-ray diffraction in transmission geometry using Stoe Stadi MP, Mythen 1k detector, Cu-K alpha radiation, λ = 1.54178 Å. Electron microscopy was performed using transmission electron microscopy (TEM) Jeol JEM-3000F, and scanning electron microscopy (SEM), Hitachi-SU8010 Cold Field Emission. To study the magnetic behavior of the structures, they were prepared directly on single crystalline SiO 2 stripes and the measurements were done using a superconducting quantum interference device vibrating sample magnetometer (SQUID-VSM, MPMS 3, Quantum Design), and a commercial vector vibrating sample magnetometer (MicroSense Model 10 VSM) equipped with a rotating electromagnet generating a maximum field of 2 T. The scanning transmission X-ray microscopy measurements were performed at the PolLux beamline 68 of the Swiss Light Source and the SoftiMAX beamline 69,70 of the MAX IV laboratory.…”
Section: Experimental and Simulationsmentioning
confidence: 99%
“…In the STXM method, the synchrotron radiation beam in the x-ray region illuminates the Fresnel zone plate which focuses the x-ray beam on the sample. At modern STXM beamlines, the resolution is 10-60 nm and is limited by the illumination spot size [229,230]. The analyzed sample is placed at the focal length of the Fresnel zone plate.…”
Section: Synchrotron Radiation-based Techniquesmentioning
confidence: 99%
“…To investigate the magnetic behavior, the structures are produced on single crystalline SiO 2 stripes, and the measurements are done using a superconducting quantum interference device vibrating sample magnetometer (SQUID-VSM, MPMS 3, Quantum Design). The scanning transmission x-ray microscopy (STXM) measurements were performed at the SoftiMAX beamline [43,44] of the MAX IV laboratory.…”
Section: Experimental and Simulationsmentioning
confidence: 99%