2008
DOI: 10.1002/sia.2828
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X‐ray photoelectron spectroscopy of SPE‐grown bcc‐Fe, polycrystal and β‐FeSi2 phases on Si(111) surfaces

Abstract: Ultrathin films of iron silicides were grown on Si(111) surfaces by solid phase epitaxy (SPE); iron deposition and subsequent annealing, and analyzed using in situ high energy-resolution X-ray photoelectron spectroscopy (XPS). We analyzed peaks using Lorentzian and Donaich-Šunjić curves and estimated the validity of both fittings. Under the sequence from bcc-Fe to polycrystal phase (the mixture of Fe 3 Si and β-FeSi 2 ), and then β-FeSi 2 phase with annealing process, the slight chemical shifts of Fe 2p 3/2 to… Show more

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Cited by 5 publications
(6 citation statements)
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“…These rods and the modulations are consistent with β-FeSi 2 on the Si(111) surface. The epitaxial orientation in the present work agrees with previous studies [2,[7][8][9][10][11][12]. The rod pattern indicate the flatness of the β-FeSi 2 (110) or β-FeSi 2 (101) film.…”
Section: Resultssupporting
confidence: 91%
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“…These rods and the modulations are consistent with β-FeSi 2 on the Si(111) surface. The epitaxial orientation in the present work agrees with previous studies [2,[7][8][9][10][11][12]. The rod pattern indicate the flatness of the β-FeSi 2 (110) or β-FeSi 2 (101) film.…”
Section: Resultssupporting
confidence: 91%
“…Sections of 3D recip- (111) is consistent with previous work by Hattori et al [11,12]. In addition to the diffuse spots from Fe(111) islands, 1 × 1 surface rods were also observed below ∼10 ML as shown in Fig.…”
Section: Resultssupporting
confidence: 90%
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