2012
DOI: 10.1088/1748-0221/7/07/p07017
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X-ray micro-beam characterization of a small pixel spectroscopic CdTe detector

Abstract: A small pixel, spectroscopic, CdTe detector has been developed at the Rutherford Appleton Laboratory (RAL) for X-ray imaging applications. The detector consists of 80 × 80 pixels on a 250 µm pitch with 50 µm inter-pixel spacing. Measurements with an 241 Am γ-source demonstrated that 96% of all pixels have a FWHM of better than 1 keV while the majority of the remaining pixels have FWHM of less than 4 keV. Using the Diamond Light Source synchrotron, a 10 µm collimated beam of monochromatic 20 keV X-rays has been… Show more

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Cited by 23 publications
(24 citation statements)
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“…These finding suggests that not only are impurities in and around the inclusion resulting in charge trapping but also that its presence is leading to a local reduction in the electric field and, as a result, an increase in the proportion of charge sharing. These effects are consistent with previous results measured in CdZnTe and CdTe detectors [ 27 , 31 ].…”
Section: Resultssupporting
confidence: 93%
See 1 more Smart Citation
“…These finding suggests that not only are impurities in and around the inclusion resulting in charge trapping but also that its presence is leading to a local reduction in the electric field and, as a result, an increase in the proportion of charge sharing. These effects are consistent with previous results measured in CdZnTe and CdTe detectors [ 27 , 31 ].…”
Section: Resultssupporting
confidence: 93%
“…Similar features in CdZnTe material have been reported previously by Veale et al [ 27 ] in Redlen spectroscopic-grade CdZnTe and more recently by Tsigaridas et al [ 7 ] in Redlen HF-CdZnTe. Similar defects have also been studied in other material systems, such as CdTe [ 28 ] and GaAs [ 29 ], where they have been described as ‘dislocation walls’.…”
Section: Resultssupporting
confidence: 88%
“…The detector array has a pixel pitch of 250 µm, a inter pixel spacing of 50 µm and an energy resolution of 0.8 keV at 59.5 keV [Veale et al, 2012]. Each pixel has an identical integrated circuit consisting of amplifiers and charge shapers.…”
Section: Methodsmentioning
confidence: 99%
“…The sensor is a 2 cm x 2 cm x 0.1 cm CdTe wafer; the readout array has a 250 µm pixel pitch with 50 µm interpixel spacing and an energy resolution of 0.8 keV at 59.5 keV 8 . Each channel has an identical set of electronics associated with it consisting of amplifiers, charge shapers and a peak hold circuit that measures the magnitude of the pulse produced by each photon when it interacts with the CdTe material, which can then be converted to energy by linear calibration 9 .…”
Section: Hexitec Pixellated Spectroscopic Detectormentioning
confidence: 99%