X-ray focussing for synchrotron radiation microprobe analysis at the SRS, Daresbury (UK)

Langevelde, F. Van; Lenglet, W.J.M.; Overwater, R. M. W.; Vis, R.D.; Huizing, A.G.; Viegers, M. P. A.; Zegers, C.P.G.; Heide, J.A. van der

doi:10.1016/0168-9002(87)90770-4

Cited by 13 publications

(4 citation statements)

References 3 publications

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“…A tabulation of photon fluxes and spatial resolutions for sever- ft, = 10 cm ftm = 10 m Figure 2. Schematics showing different approaches used for a high-resolution X-ray microscope: (a) ellipsoidal mirror at NSLS (2), (b) LBL Kirkpatrick-Baez system using spherical multilayer surfaces and tested at NSLS (3), (c) Wolter focusing mirror system with combined ellipsoidal and hyperboloidal surfaces of revolution used at Photon Factory (4), and (d) bent crystal system used at Daresbury (5). The field of view on the TV monitor is 2-10 mm, and the optical resolution is about 10 fim.…”

Section: Types Of Xrf X-ray Microscopesmentioning

confidence: 99%

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Trace element determinations with synchrotron-induced x-ray emission

Jones¹,

Gordon²

1989

Anal. Chem.

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X-ray fluorescence (XRF) analysis has played an important role in elemental chemical analysis for many years. The synchrotron radiation (SR) X-ray source that has been developed in the last 10-20 years represents a revolutionary improvement in X-ray production technology. By using SR for XRF analysis, researchers can make measurements with improved sensitivity and spatial resolution.Results obtained with SR show that measurements with a spatial resolution of less than 100 ftm2 and a minimum detection limit (MDL) approaching 1 fg can be made in just 300 s. The XRF method traditionally has been used because of its multielement detection capability, minimal sample preparation, minimal damage to the sample, and ability to operate at atmospheric pressure with solid, liquid, or gaseous samples. The substitution of the SR source preserves all these attributes and opens new opportunities for exploiting the XRF method. For example, a trace element X-ray microscope can be used to

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Section: Types Of Xrf X-ray Microscopesmentioning

confidence: 99%

“…(4) measured a resolution of 10 X 30 with a Wolter-type mirror system, and Van Langevelde et al (5) obtained 30 ^m at the Daresbury synchrotron using a doubly bent Si crystal system. Thus the best resolutions obtained with the first generation of synchrotron microprobes are on the order of 10 jim or more.…”

Section: Spatial Resolution Of the Xrmmentioning

confidence: 99%

Trace element determinations with synchrotron-induced x-ray emission

Jones¹,

Gordon²

1989

Anal. Chem.

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show abstract

“…(4) measured a resolution of 10 X 30 μπι with a Wolter-type mirror system, and Van Langevelde et al (5) obtained 30 μπι at the Daresbury synchrotron using a doubly bent Si crystal system. Thus the best resolutions obtained with the first generation of synchrotron microprobes are on the order of 10 μπι or more.…”

Section: Spatial Resolution Of the Xrmmentioning

confidence: 99%

“…Schematics showing different approaches used for a high-resolution X-ray microscope: (a) ellipsoidal mirror at NSLS (2), (b) LBL Kirkpatrick-Baez system using spherical multilayer surfaces and tested at NSLS (3), (c) Wolter focusing mirror system with combined ellipsoidal and hyperboloidal surfaces of revolution used at Photon Factory (4), and (d) bent crystal system used at Daresbury(5).…”

mentioning

confidence: 99%

Trace Element Determinations with Synchrotron-Induced X-Ray Emission

Jones¹,

Gordon²

1989

Anal. Chem.

View full text Add to dashboard Cite

X-ray fluorescence (XRF) analysis has played an important role in elemental chemical analysis for many years. The synchrotron radiation (SR) X-ray source that has been developed in the last 10-20 years represents a revolutionary improvement in X-ray production technology. By using SR for XRF analysis, researchers can make measurements with improved sensitivity and spatial resolution.Results obtained with SR show that measurements with a spatial resolution of less than 100 pm2 and a minimum detection limit (MDL) approaching 1 fg can be made in just 300 s. The XRF method traditionally has been used because of its multielement detection capability, minimal sample preparation, minimal damage to the sample, and ability to operate at atmospheric pressure with solid, liquid, or gaseous samples. The substitution of the SR source preserves all these attributes and opens new opportunities for exploiting the XRF method. For example, a trace element X-ray microscope can be used to

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Röntgenfluoreszenzanalyse mit Synchrotronstrahlung

Gaul

Knöchel

1994

Analytiker-Taschenbuch

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X-ray focussing for synchrotron radiation microprobe analysis at the SRS, Daresbury (UK)

Cited by 13 publications

References 3 publications

Trace element determinations with synchrotron-induced x-ray emission

Trace element determinations with synchrotron-induced x-ray emission

Trace Element Determinations with Synchrotron-Induced X-Ray Emission

Röntgenfluoreszenzanalyse mit Synchrotronstrahlung

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