“…The Si-Fulp XRD pattern corresponds to a crystallized face-centred cubic lattice of C 60 with the diffraction planes (111), (220), (311), (222), (331), (420), (442) and (333) at 10.6, 12.3, 17.5, 20.6, 24.5, 27.2, 27.9, 30.7, and 32.5 2q angles. 38 Finally, the pattern of Si-Fulp/ceria only shows the diffraction peaks attributed to cerium oxide, proving that no residual Si-Fulp crystals remained aer functionalization and purication.…”