2007
DOI: 10.1109/lpt.2007.891979
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Width Dependence of Inherent TM-Mode Lateral Leakage Loss in Silicon-On-Insulator Ridge Waveguides

Abstract: We report the first experimental observation in the optical domain of a dramatic width-dependent lateral leakage loss behavior for the TM-like mode of tight vertical confinement ridge waveguides formed in silicon-on-insulator. The lateral leakage loss displays a series of sharp cyclic minima at precise waveguide widths, and appears to be inherent to waveguide geometries of central importance to a wide variety of active devices in silicon photonics requiring lateral electrical access. This behavior is not predi… Show more

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Cited by 120 publications
(110 citation statements)
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“…S2, obtained at a coupling angle of θ = -26.5°, the extinction ratio for the SOI ring-resonator whispering-gallery modes is largest near λ = 1550 nm, where the "magic-width" condition is satisfied. 4 The loaded resonator quality factor for the resonance centered near λ = 1549.5 nm is 94,000. By accounting for coupling loss, the intrinsic quality factor due to propagation loss, Q int , can be determined.…”
Section: Characterization Of Soi Waveguide Modesmentioning
confidence: 99%
“…S2, obtained at a coupling angle of θ = -26.5°, the extinction ratio for the SOI ring-resonator whispering-gallery modes is largest near λ = 1550 nm, where the "magic-width" condition is satisfied. 4 The loaded resonator quality factor for the resonance centered near λ = 1549.5 nm is 94,000. By accounting for coupling loss, the intrinsic quality factor due to propagation loss, Q int , can be determined.…”
Section: Characterization Of Soi Waveguide Modesmentioning
confidence: 99%
“…This depends strongly on the relative thicknesses of the waveguide core and the etched side cladding. Previous demonstrations of this phenomenon have relied on very shallow patterning (15 nm) of the rib waveguides, using a local oxidation process [1]. In this paper, we demonstrate this effect in a standard silicon photonics platform and provide a quantitative characterisation.…”
Section: Lateral Leakage In Silicon Ridge Waveguidesmentioning
confidence: 72%
“…High-contrast rib waveguides exhibit a peculiar loss behaviour for the TM polarisation, with a strong dependence on waveguide width (w) [1]. Within the rib waveguide the TMlike mode has in-plane E-field components at the sidewalls, which gives rise to a non-zero overlap with the TE modes in the cladding.…”
Section: Lateral Leakage In Silicon Ridge Waveguidesmentioning
confidence: 99%
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