11th International Conference on Group IV Photonics (GFP) 2014
DOI: 10.1109/group4.2014.6962028
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Experimental demonstration of TM lateral leakage in a standard SOI photonics platform

Abstract: Abstract-We provide an experimental demonstration of the width dependent losses of the fundamental TM guided mode in fabricated silicon-on-insulator shallow etched ridge waveguides.

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“…This demonstration will improve the understanding and confidence in lateral leakage so that new and interesting devices can be developed and adopted into industrial integrated silicon photonic systems. Preliminary material from this work was published in [8]; however, here we present deeper analysis and substantial additional results. …”
Section: Introductionmentioning
confidence: 94%
“…This demonstration will improve the understanding and confidence in lateral leakage so that new and interesting devices can be developed and adopted into industrial integrated silicon photonic systems. Preliminary material from this work was published in [8]; however, here we present deeper analysis and substantial additional results. …”
Section: Introductionmentioning
confidence: 94%