Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)
DOI: 10.1109/eosesd.2000.890117
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VerifyESD: a tool for efficient circuit level ESD simulations of mixed-signal ICs

Abstract: For many classes of technologies and circuits, it is beneficial to perform circuit simulations for ESD design, verification, and predictions of performance. This is particularly true for mixed-signal ICs, where complex interaction between I/Os and multiple power supplies make manual analysis difficult and error prone. Unfortunately, high node and component counts typically prohibit simulations of an entire circuit. Thus, a manual intervention by the designer is usually required to minimize the circuit size. Th… Show more

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Cited by 20 publications
(6 citation statements)
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“…It avoids convergence problems due to the strong nonlinear snap back characteristic, because a single additional breakdown diode is introduced in order to model breakdown characteristics. This approach has similarly been used also by other authors [9,10].…”
Section: Introductionmentioning
confidence: 73%
“…It avoids convergence problems due to the strong nonlinear snap back characteristic, because a single additional breakdown diode is introduced in order to model breakdown characteristics. This approach has similarly been used also by other authors [9,10].…”
Section: Introductionmentioning
confidence: 73%
“…The problem of pin-to-pin discharge combinations is discussed in several, with efforts to minimize the number of simulations required [3] [5][6].…”
Section: B Previous Workmentioning
confidence: 99%
“…The authors in [7] present an algorithm for determining the most probable ESD path, based on summing up and weighting the resistance in each alternative ESD path. The discussion in [8] offers a two-step approach to the HBM-simulation at chip-level complexity. In the first step, critical ESD paths are identified by evaluating each possible current path with a set of rules including breakdown thresholds etc.…”
Section: Introductionmentioning
confidence: 99%
“…Some promising approaches are described in [6][7][8]. In [6] a routine for simulation of CDM current paths between discrete, RC-modelled building blocks is proposed.…”
Section: Introductionmentioning
confidence: 99%