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Electrical rule checking is fundamental to achieve a good U 0 cell placement. This paper presents the analysis techniques used to design a robust power-grid structure, the method used to make 110 cell placement guidelines, details of the U 0 cell placement process and electrical checking algorithms.

Design tools for ESD are described that ensure robust protection at both the cell and chip level in a high-volume, highly automated ASIC design system. There are three primary components: Design Rule Checking (DRC) for ESD; transient CDM simulations on extracted netlists; and analysis of chip-level power supply net resistances.

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