Verification of CAM tests for input stuck-at faults

Transistor-level fault analysis and test algorithm development for ternary dynamic content addressable memories

“…Consequently, most research into memory testing was directed to SRAMs and DRAMs with very little emphasis on CAMs. The only previous works of note are [5] - [8] which focus on testing binary static CAMs, and [9] which focuses on TLBs, which are also static binary CAMs.…”