Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-0 2003
DOI: 10.1109/ats.2003.1250841
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Testing delay faults in embedded CAMs

Xiaogang Du
1
,
Reddy Reddy
2
,
Rayhawk Rayhawk3
et al.
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Cited by 9 publications
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