Validation of the PVLife model using 3 million module-years of live site data

Hasselbrink, Ernest F.; Anderson, M. L.; Defreitas, Zoe; Mikofski, Mark A.; Shen, Yuting; Caldwell, Sander; Terao, A.; Kavulak, David F. J.; Campeau, Zach; DeGraaff, David

doi:10.1109/pvsc.2013.6744087

Cited by 65 publications

(43 citation statements)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The year-over-year approach calculates the degradation rate for the same week of the year in subsequent years and then takes the median of the resulting degradation rate distribution. [15] All methods show a positive rate of change over the six years, meaning performance improvement over time. Uncertainty decreases as the step size around Pmax/DNI is decreased (smaller step equals fewer data points).…”

Section: Resultsmentioning

confidence: 95%

Degradation analysis of a CPV module after six years on-Sun

Muller¹,

Jordan²,

Kurtz³

2015

AIP Conference Proceedings

View full text Add to dashboard Cite

Abstract. There are many publications in the literature that determine long-term degradation of PV modules and systems but there is little in this area on CPV due to this industry's young age. This work focuses on analyzing the degradation of a Soitec CPV module (Concentrix CX200-09) which has been on-sun at NREL since early 2009. Furthermore the focus is on determining the applicability of degradation calculation procedures that have been developed using flat plate PV data.

show abstract

Section: Resultsmentioning

confidence: 95%

Degradation analysis of a CPV module after six years on-Sun

Muller¹,

Jordan²,

Kurtz³

2015

AIP Conference Proceedings

View full text Add to dashboard Cite

show abstract

“…The details of the tests that are being proposed are based on observations of the most commonly observed field failures [25,28,[32][33][34][35][36].…”

Section: A Durable Design: Qualifying the Design For The Intended Apmentioning

confidence: 99%

Three-prong path to comprehensive technical standards for photovoltaic reliability

Kurtz

Wohlgemuth

Sample

et al. 2014

2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)

View full text Add to dashboard Cite

As the photovoltaic (PV) industry has grown, the long-term reliability of PV systems has become increasingly important. Many organizations are taking on the challenge of this multi-faceted issue. This paper describes three closely coordinated efforts that together will provide a comprehensive set of consensus standards and specifications for the technical aspects of verifying PV system quality and bankability. These three efforts are developing standards for 1) qualifying the design for the intended application (climate zone and mounting configuration), 2) quality management systems for PV module manufacturing, and 3) system-level inspections to ensure appropriate design, installation, commissioning, and operation of PV systems. A pathway has been identified for international implementation of these standards through the International Electrotechnical Commission.

show abstract

“…This work focuses on the estimation of system-level degradation from historical time-series power data. Recent advances in this area include the year-on-year (YOY) estimation method [2], using clear sky models for robustness to irradiance sensor issues [3], and the development of RdTools to standardize and automate the process of estimating system degradation rates from historical timeseries data [4].…”

Section: Introductionmentioning

confidence: 99%

Signal Processing on PV Time-Series Data: Robust Degradation Analysis Without Physical Models

Meyers

Deceglie

Deline

et al. 2020

IEEE J. Photovoltaics

View full text Add to dashboard Cite

A novel unsupervised machine learning approach for analyzing time-series data is applied to the topic of photovoltaic (PV) system degradation rate estimation, sometimes referred to as energy-yield degradation analysis. This approach only requires a measured power signal as an input-no irradiance data, temperature data, or system configuration information. We present results on a data set that was previously analyzed and presented by NREL using RdTools, validating the accuracy of the new approach and showing increased robustness to data anomalies while reducing the data requirements to carry out the analysis.

show abstract

Validation of the PVLife model using 3 million module-years of live site data

Cited by 65 publications

References 4 publications

Degradation analysis of a CPV module after six years on-Sun

Degradation analysis of a CPV module after six years on-Sun

Three-prong path to comprehensive technical standards for photovoltaic reliability

Signal Processing on PV Time-Series Data: Robust Degradation Analysis Without Physical Models

Contact Info

Product

Resources

About