2018
DOI: 10.1007/s00339-018-2326-6
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V-groove etched 1-eV-GaInNAs nipi solar cell

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Cited by 6 publications
(1 citation statement)
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“…Each wafer run may present different statistics due to material deposition doping and processing, see Figure 6B. Nonetheless, the wafer uniformity wavelength map is in general scarcely reported by the foundries, some works suggest these claims [79,80]. Tight control of the doping process may reduce this variation and greatly improve the yield and temperature control mechanisms.…”
Section: Band and Wavelength Selection Criteriamentioning
confidence: 99%
“…Each wafer run may present different statistics due to material deposition doping and processing, see Figure 6B. Nonetheless, the wafer uniformity wavelength map is in general scarcely reported by the foundries, some works suggest these claims [79,80]. Tight control of the doping process may reduce this variation and greatly improve the yield and temperature control mechanisms.…”
Section: Band and Wavelength Selection Criteriamentioning
confidence: 99%