Daniel Smale, Steve Haley, Joel Segal, Ronaldo Ronaldo, Svetan Ratchev, Richard K. Leach, James D. Claverley
Abstract:The measurement of features from the micro-and precision manufacturing industries requires low uncertainties and nano-scale resolution. These are best delivered through ultra precise co-ordinate measuring machines (CMMs). However, current CMMs are often restricted by the relatively large and insensitive probes used. This paper focuses on the assembly challenges of a novel micro-CMM probe. The probe is comprised of a 70 µm glass sphere, attached to a solid tungsten-carbide shaft of diameter less than 100 µm, jo…
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