2017
DOI: 10.1016/j.solmat.2017.04.005
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Using ISOS consensus test protocols for development of quantitative life test models in ageing of organic solar cells

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Cited by 48 publications
(49 citation statements)
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“…The ISOS testing protocols do not provide direct information on the expected lifetime of solar cells under operational conditions. For such evaluations, the concept of acceleration factor (AF) has been used 134 . The AF is a constant that relates the times to failure in an accelerated stress test with that in a reference stress test.…”
Section: Stability Figures Of Merit and Acceleration Factorsmentioning
confidence: 99%
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“…The ISOS testing protocols do not provide direct information on the expected lifetime of solar cells under operational conditions. For such evaluations, the concept of acceleration factor (AF) has been used 134 . The AF is a constant that relates the times to failure in an accelerated stress test with that in a reference stress test.…”
Section: Stability Figures Of Merit and Acceleration Factorsmentioning
confidence: 99%
“…To date, no reports have been made of AFs of PSCs subjected to accelerated ageing, but they should appear as the technology matures. For organic solar cells, more attempts have been made to deduce AFs for accelerated ageing42,134,135 . AFs for most ISOS tests were determined relative to outdoor conditions in northern Europe using OPV mini modules134 .…”
mentioning
confidence: 99%
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“…During a light soaking test, the device is continuously exposed under illumination and the performances are monitored periodically measuring J – V characteristic. This testing approach has been largely used for dye‐sensitized and organic solar cells, where it has been demonstrated to give a good estimation of the device degradation in real working condition . In case of PSCs the ion migration may significantly complicate the ageing test .…”
Section: Stability: Overview and Strategiesmentioning
confidence: 99%
“…This testing approachh as been largely used for dye-sensitized and organic solar cells, where it has been demonstrated to give ag ood estimation of the deviced egradation in real workingc ondition. [164] In case of PSCs the ion migration may significantly complicate the ageing test. [165] In af reshly-made device, the impact of the ion migration on the J-V characteristic has been widely investigated, with clear conclusion that slow voltage sweep rates are neededi no rder to extract reliable performance parameters, that is, reducingt he occurrence of hysteresis in the J-V curves.…”
Section: Stability:o Verview and Strategiesmentioning
confidence: 99%