Advances in Electronic Packaging, Parts A, B, and C 2005
DOI: 10.1115/ipack2005-73223
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Using High Speed Camera for Electronic Board Failure Analysis

Abstract: Historically, the most common failure analyses metrologies have been dye-and-pull, cross-sections, microscopy, optical and SEM. Using these traditional metrologies to find a root cause from a dynamic event can be very time consuming and sometimes inconclusive. The standard methodology is to work backward to reconstruct the “event” that caused or initiated failure. Often times the root cause is not immediately obvious and design improvements require an iterative process to identify the true root cause. This app… Show more

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“…The deflection is measured using a high-speed camera system and motion capture software [7]. The comparison shows good matching in terms of maximum deflection and frequency of the vibration, as shown in Fig.…”
Section: Figure 3 Jedec Drop Test Board Dimensions In MMmentioning
confidence: 88%
“…The deflection is measured using a high-speed camera system and motion capture software [7]. The comparison shows good matching in terms of maximum deflection and frequency of the vibration, as shown in Fig.…”
Section: Figure 3 Jedec Drop Test Board Dimensions In MMmentioning
confidence: 88%