2019
DOI: 10.1088/1361-6463/ab52f8
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Ultraviolet/vacuum-ultraviolet emission from a high power magnetron sputtering plasma with an aluminum target

Abstract: We report the in situ measurement of the ultraviolet/vacuum-ultraviolet (UV/VUV) emission from a plasma produced by high power impulse magnetron sputtering with aluminum target, using argon as background gas. The UV/VUV detection system is based upon the quantification of the re-emitted fluorescence from a sodium salicylate layer placed in a housing inside the vacuum chamber at 11 cm from the center of the cathode. The detector is equipped with filters that allow for differentiating various spectral regions, a… Show more

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Cited by 5 publications
(12 citation statements)
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“…To contribute to a better understanding of this, the emission spectrum of the sputter was measured through the window of the sputtering chamber (see Figure S3). The spectrum reveals that the peaks at the wavelength (λ) 325 nm correspond to UV, while the peaks at 450 and 600 nm may correspond to the plasma. , To decouple the bombardment damage from UV/plasma damage, we performed an experiment in which the ITO/PTAA/3C-IL/PC 61 BM/BCP device was masked with a glass microscope slide and subjected to UV/plasma (see Figure a). This enables only UV/plasma treatment of the device, rather than the harsh bombardment of plasma particles.…”
Section: Resultsmentioning
confidence: 99%
“…To contribute to a better understanding of this, the emission spectrum of the sputter was measured through the window of the sputtering chamber (see Figure S3). The spectrum reveals that the peaks at the wavelength (λ) 325 nm correspond to UV, while the peaks at 450 and 600 nm may correspond to the plasma. , To decouple the bombardment damage from UV/plasma damage, we performed an experiment in which the ITO/PTAA/3C-IL/PC 61 BM/BCP device was masked with a glass microscope slide and subjected to UV/plasma (see Figure a). This enables only UV/plasma treatment of the device, rather than the harsh bombardment of plasma particles.…”
Section: Resultsmentioning
confidence: 99%
“…The publication by Iglesias et al [ 34 ] stands out from others because the electron density was much higher (around two orders of magnitude) than in other publications. HiPIMS is typically used for the deposition of thin films on substrates with complex geometry.…”
Section: State Of the Art And Correlationsmentioning
confidence: 98%
“…The authors also noted that for polystyrene, the VUV absorption coefficient was sufficiently low, so the VUV photons traveled much deeper through the layers compared with the ions that deposit energy only through the first nanometers or so. Iglesias et al [34] 1300-24,000…”
Section: Vuv Effect On Materialsmentioning
confidence: 99%
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