2010
DOI: 10.1088/0964-1726/19/3/035009
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Ultrahigh yield stress in a general electrorheological fluid under compression

Abstract: The yield stress induced by external electric field generally of the order of kV mm −1 is an important parameter for an electrorheological (ER) fluid. An ultrahigh yield stress of over 100 kPa of a general ER fluid in a slow compressive flow under an electric field of less than 0.6 kV mm −1 has been achieved in this study, while its shear yield stress tested on a shear rheometer is only 0.6 kPa. A lower compressive velocity results in a higher yield stress under the same electric field. The large difference be… Show more

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Cited by 18 publications
(17 citation statements)
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References 32 publications
(70 reference statements)
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“…The exponent m is in range of 2.06–2.88, which almost agrees with the theoretical analysis. This result is in agree with that for MR fluids 14 and is similar to that for ER fluids 21 . But comparing with the effect of the magnetic field or original gap distance, the compressive velocity has not strong influence on the changing of compressive stress during the compression.…”
Section: Resultssupporting
confidence: 91%
“…The exponent m is in range of 2.06–2.88, which almost agrees with the theoretical analysis. This result is in agree with that for MR fluids 14 and is similar to that for ER fluids 21 . But comparing with the effect of the magnetic field or original gap distance, the compressive velocity has not strong influence on the changing of compressive stress during the compression.…”
Section: Resultssupporting
confidence: 91%
“…23. [207][208][209] In the compression test along the direction of the electric field, the compressive stress obtained represents the resistance of the ER fluid. Compared to the shear yield stress (measured by the HAAKE RV20 rheometer) and tensile yield stress in elongation, the compressive stress taken from the end point of the compression tested showed the highest value (Fig.…”
Section: Compressive Stressmentioning
confidence: 99%
“…23,24 By investigating the performance of ER uids subjected to compressive loading, EI Wahed found the imposed force was highly dependent on the applied voltage and the weight fraction of the dispersed solid-phase. 25 Liu et al studied the normal force of the ER uid employed for the haptic application, showing the application of the usage of compression mode.…”
Section: 22mentioning
confidence: 99%