2009 IEEE International Ultrasonics Symposium 2009
DOI: 10.1109/ultsym.2009.5441939
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Ultra-thin-film AlN contour-mode resonators for sensing applications

Abstract: This paper reports on the design and experimental verification of a new class of ultra-thin-film (250 nm) aluminum nitride (AlN) microelectromechanical system (MEMS) contour mode resonators (CMRs) suitable for the fabrication of ultra-sensitive gravimetric sensors. The device thickness was opportunely scaled in order to increase the mass sensitivity, while keeping a constant frequency of operation. In this first demonstration the resonance frequency of the device was set to 178 MHz and a mass sensitivity as hi… Show more

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Cited by 21 publications
(16 citation statements)
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“…For small magnetic field sensing (0 -10 Oe), the measured resonance frequency sensitivity to DC magnetic field is approximately 1 Hz/nT. The transient response of the device was measured by exciting the sensor at a single frequency, f c , and monitoring the variation over time of the device admittance amplitude [8]. The excitation frequency, f c = 215.9 MHz, was set between the series and parallel resonances, where the slope of admittance amplitude curve versus frequency is maximum [8].…”
Section: Figure 5: Measured Admittance and Bvd Model Fitting Of The Fmentioning
confidence: 99%
See 1 more Smart Citation
“…For small magnetic field sensing (0 -10 Oe), the measured resonance frequency sensitivity to DC magnetic field is approximately 1 Hz/nT. The transient response of the device was measured by exciting the sensor at a single frequency, f c , and monitoring the variation over time of the device admittance amplitude [8]. The excitation frequency, f c = 215.9 MHz, was set between the series and parallel resonances, where the slope of admittance amplitude curve versus frequency is maximum [8].…”
Section: Figure 5: Measured Admittance and Bvd Model Fitting Of The Fmentioning
confidence: 99%
“…The transient response of the device was measured by exciting the sensor at a single frequency, f c , and monitoring the variation over time of the device admittance amplitude [8]. The excitation frequency, f c = 215.9 MHz, was set between the series and parallel resonances, where the slope of admittance amplitude curve versus frequency is maximum [8]. The measured transient response of the sensor under low frequency (0.1 Hz and 1 Hz) square wave magnetic field applied is shown in Figure 8.…”
Section: Figure 5: Measured Admittance and Bvd Model Fitting Of The Fmentioning
confidence: 99%
“…(2) [5,6]. (2) It is worth nothing that the resonance frequency, f 0 , and the thickness, T, of the CMR-S are two independent variables while for FBARs and QCMs they are intrinsically coupled and cannot be set independently from one another.…”
Section: Nanoscaled Cmr-s Designmentioning
confidence: 99%
“…These issues have been recently overcome by AlN Contour-Mode Resonant Sensors (CMR-S) [4,5,6]. In fact, this technology enables the fabrication of ultra-sensitive nanoscaled devices that can be piezoelectrically actuated and sensed directly on chip [5].…”
Section: Introductionmentioning
confidence: 99%
“…It is therefore essential that this parameter is monitored when scaling the device into the nano realm. The need for a high and constant k t 2 -Q justifies the use of AlN piezoelectric films for the transduction of the resonator, which have shown to maintain high Q and high coupling even when the film thickness is scaled to sub-micron dimensions [28]. This is another advantage of the AlN CMR-S technology over other solutions based on electrostatically-transduced devices [10], whose coupling generally degrades with the frequency of operation.…”
Section: Aln Cmr-s Oscillator Designmentioning
confidence: 99%