Ultra High Energy Resolution EELS Map Employing an Aberration-corrected STEM Equipped with a Monochromator

In this article, we report the development of a new 200-kV analytical electron microscope equipped with a monochromator with an integrated double Wien-filter system. It enables us to study the electronic structures of materials in detail using electron energy-loss spectroscopy (EELS) analysis at an atomic scale. A highly monochromated and isotropically round electron probe is produced on the specimen plane. The ultimate energy resolutions with 0.1-s acquisition times are measured to be 36 meV at 200 kV and 30 meV at 60 kV. In an EELS mapping experiment performed on SrTiO3 with a monochromated electron probe whose energy resolution is 146 meV, an elemental map exhibits atomic resolution.

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Development of a monochromator for aberration-corrected scanning transmission electron microscopy

Mukai

Okunishi

Ashino

et al. 2015

Microscopy (Tokyo)

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Ultra High Energy Resolution EELS Map Employing an Aberration-corrected STEM Equipped with a Monochromator

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Development of a monochromator for aberration-corrected scanning transmission electron microscopy

Development of a monochromator for aberration-corrected scanning transmission electron microscopy

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