Two parameter Bendel model calculations for predicting proton induced upset (ICs)

Abstract

h3STRACTThe present best method of predicting proton induced SEU rates in the proton radiation belts is given by W.L. Bendel [1,2, and 31. It is a semi-empirical technique and describes the upset cross section as a function of a single experimental parameter. Bendel presented a two parameter approach in [3] but decided to emphasize the simpler one parameter approach since it could adequately describe the available data. Shimano et al. [4] presented results showing slight improvements in the fits using the two parameter Bendel model, and a slightly different two parameter model has been used by Normand [5]. Recent energy dependent experiments at this and other laboratories [6] on small feature size devices have produced data that is clearly not adequately fit by the single parameter approach. This paper demonstrates that improved fits of both new and old data can be obtained with a two parameter approach. Shimano's work focussed on four devices, three of which are from older technologies with large feature sizes (> 1.5 pm) and are no longer representative of the newer small feature sized (< 1.5 pm) devices. This work provides summary analyses with the improved Bendel model on much of the existing published proton data [S-131, and also on recent data [6,14, and 151 on newer devices.

Single event upset and charge collection measurements using high energy protons and neutrons

“…This is a notably larger energy dependence than the standard asymptotic behaviors that is usually displayed, both by the Bendel 2-parameter model [20] and actual data over the 30-1000 MeV range [20]. However, it is also true that most researchers report cross sections at only one high energy (> 200 MeV) point, so it is unclear just how real this slowly asymptoting effect is.…”

Effects of non-ionizing radiation on a 130 nm CMOS SRAM for low earth orbit applications

“…The CREME96 proton-induced upset (PUP) module uses the Bendel-2 [11], Bendel-1 [12], and Weibull [10], [13] models to predict SEU rates due to spallations. Given actual measured SEU data for the specific technology being studied, these empirical models can predict SEU rates in various radiation environments.…”

The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft

“…The first method is to determine the values of σ p (E) experimentally at accelerators with variation of proton energy (E > 10 MeV), and then to approximate these values using a two-parameter Bendel function [43].…”