Abstract:Because of the aggressive scaling of integrated circuits and the given limits of atomic scales, circuit designers have to become more and more aware of the arising reliability and yield concerns. So far, only very little research efforts have been put into lowlevel approaches for lifetime reliability, whereas lots of efforts have focused on soft-errors and system-level solutions. In this paper, we introduce and compare three diverse design approaches which apply redundancy on different abstraction levels to en… Show more
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