Tuning of diameter and electronic type of CCVD grown SWCNTs: A comparative study on Co-Mo and Co-Ru bimetallic catalyst systems

Jafarpour, Saeed Motaragheb; Schulz, Stefan E.; Hermann, Sascha

doi:10.1016/j.diamond.2018.06.015

Cited by 2 publications

(2 citation statements)

References 45 publications

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“…Regarding semiconducting type-enhanced CVD growth, progress has been made through cloning of semiconducting CNTs [50], [51], integration of molecular seeds [52]- [54], specific catalyst configurations [55] and engineered catalyst particles. For the latter approach the catalyst particles have been externally synthesized and subsequently deposited on the substrate.…”

Section: Device Technologymentioning

confidence: 99%

CNTFET Technology for RF Applications: Review and Future Perspective

et al. 2021

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RF CNTFETs are one of the most promising devices for surpassing incumbent RF-CMOS technology in the near future. Experimental proof of concept that outperformed Si CMOS at the 130 nm technology has already been achieved with a vast potential for improvements. This review compiles and compares the different CNT integration technologies, the achieved RF results as well as demonstrated RF circuits. Moreover, it suggests approaches to enhance the RF performance of CNTFETs further to allow more profound CNTFET based systems e.g., on flexible substrates, highly dense 3D stacks, heterogeneously combined with incumbent technologies or an all-CNT system on a chip.

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Section: Device Technologymentioning

confidence: 99%

CNTFET Technology for RF Applications: Review and Future Perspective

et al. 2021

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“…As one of the many applications, we can take a closer look at CNT devices. Special cases of such are interconnects formed by vertically aligned CNTs grown by means of chemical vapor deposition (CVD), mechanically bendable conductive lines made from conductive CNTs, and horizontally aligned conductive tracks using multi‐walled CNTs (MWCNTs) as well as CNTFETs using semiconducting SWCNTs . For the first case of CNT vias, local electrical probing allowed a resistivity mapping of grown CNTs or mapping down to the individual CNT .…”

Section: Electrical Propertiesmentioning

confidence: 99%

Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales

Sheremet

Meszmer

Blaudeck

et al. 2019

Physica Status Solidi (a)

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The present study covers the nanoanalysis methods for four key material characteristics: electrical and electronic properties, optical, stress and strain, and chemical composition. With the downsizing of the geometrical dimensions of the electronic, optoelectronic, and electromechanical devices from the micro to the nanoscale and the simultaneous increase in the functionality density, the previous generation of microanalysis methods is no longer sufficient. Therefore, the metrology of materials' properties with nanoscale resolution is a prerequisite in materials' research and development. The article reviews the standard analysis methods and focuses on the advanced methods with a nanoscale spatial resolution based on atomic force microscopy (AFM): current-sensing AFM (CS-AFM), Kelvin probe force microscopy (KPFM), and hybrid optical techniques coupled with AFM including tip-enhanced Raman spectroscopy (TERS), photothermal-induced resonance (PTIR) characterization methods (nano-Vis, nano-IR), and photo-induced force microscopy (PIFM). The simultaneous acquisition of multiple parameters (topography, charge and conductivity, stress and strain, and chemical composition) at the nanoscale is a key for exploring new research on structure-property relationships of nanostructured materials, such as carbon nanotubes (CNTs) and nano/microelectromechanical systems (N/MEMS). Advanced nanocharacterization techniques foster the design and development of new functional materials for flexible hybrid and smart applications.

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Tuning of diameter and electronic type of CCVD grown SWCNTs: A comparative study on Co-Mo and Co-Ru bimetallic catalyst systems

Cited by 2 publications

References 45 publications

CNTFET Technology for RF Applications: Review and Future Perspective

CNTFET Technology for RF Applications: Review and Future Perspective

Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales

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