2010
DOI: 10.1088/1367-2630/12/9/093035
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Trapped-ion probing of light-induced charging effects on dielectrics

Abstract: We use a string of confined 40 Ca + ions to measure perturbations to a trapping potential which are caused by light-induced charging of an anti-reflection coated window and of insulating patches on the ion-trap electrodes. The electric fields induced at the ions' position are characterised as a function of distance to the dielectric, and as a function of the incident optical power and wavelength. The measurement of the ion-string position is sensitive to as few as 40 elementary charges per √ Hz on the dielectr… Show more

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Cited by 134 publications
(146 citation statements)
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“…For the stretch mode, the sources of frequency fluctuations (which are slow compared to the gate durations shown in Fig. 6) are (i) fluctuations in the DC potentials applied to electrodes for trapping, (ii) fluctuating electric-field gradients from uncontrolled charging of electrode surfaces [42], and (iii) non-linear coupling to transverse "rocking" modes [43,44]. By measuring the lineshape for exciting the motional state of a single ion with injected RF "tickle" potentials on the trap electrodes at frequencies near the mode frequencies, we estimate the first two sources contribute fluctuations of approximately 50 Hz.…”
Section: Error Sourcesmentioning
confidence: 99%
“…For the stretch mode, the sources of frequency fluctuations (which are slow compared to the gate durations shown in Fig. 6) are (i) fluctuations in the DC potentials applied to electrodes for trapping, (ii) fluctuating electric-field gradients from uncontrolled charging of electrode surfaces [42], and (iii) non-linear coupling to transverse "rocking" modes [43,44]. By measuring the lineshape for exciting the motional state of a single ion with injected RF "tickle" potentials on the trap electrodes at frequencies near the mode frequencies, we estimate the first two sources contribute fluctuations of approximately 50 Hz.…”
Section: Error Sourcesmentioning
confidence: 99%
“…Integrated optics are not easily made reconfigurable, so their alignment to the ions must be partially built into the trapping architecture. The second problem is that dielectric surfaces are susceptible to light-induced charging, which results in strong and difficult-to-control forces on the ions, inducing micromotion, large displacements, or even making the ions untrappable [79][80][81]. Nonetheless, these challenges have started to be addressed in the last several years by a number of groups integrating various optical elements with ion traps, including microfabricated phase Fresnel lenses [82,83], embedded micromirrors [84,85] and fibers [45,86], transparent trap electrodes [44], nanophotonic dielectric waveguides [87], macroscopic optical cavities [46,[88][89][90][91], and microscopic, fiber-based cavities [92].…”
Section: Incorporating Optical Componentsmentioning
confidence: 99%
“…While strong coupling can be achieved by reducing the cavity's mode volume, shrinking the physical volume of the cavity around trapped ions is technically challenging. This is because the dielectric surfaces of the cavity mirrors can adversely affect the trapping potential [13]. For this reason, strong coupling remains elusive for a single ion despite many proposed designs and implementations [14][15][16][17].…”
Section: Introductionmentioning
confidence: 99%