2009
DOI: 10.1002/pssc.200881359
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Transient reflectivity response with negative time delay caused by femtosecond pulse propagation in GaAs thin films

Abstract: We have investigated the propagation effects on the transient response of confined excitons in GaAs thin films by a reflection‐type pump‐probe technique. The spectrally integrated signal demonstrated slower rise than the pulse width in the negative time region. Moreover, reflectivity change spectra indicate that the response in the negative time region originates from the effect of the confined excitons and that the signal rise time at each exciton state is different. The propagation velocities estimated from … Show more

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Cited by 4 publications
(7 citation statements)
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“…For optical control in the exciton region, the characteristics of excitonic polaritons in the transient signals should be clarified. In the transient-grating and pump-probe signals under exciton resonant conditions, a slow rise much longer than the pulse width was observed in the negative time region [12,13]. The propagation velocity estimated from the film thickness and the rise time τ Rise almost agrees with the group velocity of the exciton-polariton in a bulk GaAs crystal [13].…”
supporting
confidence: 50%
See 3 more Smart Citations
“…For optical control in the exciton region, the characteristics of excitonic polaritons in the transient signals should be clarified. In the transient-grating and pump-probe signals under exciton resonant conditions, a slow rise much longer than the pulse width was observed in the negative time region [12,13]. The propagation velocity estimated from the film thickness and the rise time τ Rise almost agrees with the group velocity of the exciton-polariton in a bulk GaAs crystal [13].…”
supporting
confidence: 50%
“…In the transient-grating and pump-probe signals under exciton resonant conditions, a slow rise much longer than the pulse width was observed in the negative time region [12,13]. The propagation velocity estimated from the film thickness and the rise time τ Rise almost agrees with the group velocity of the exciton-polariton in a bulk GaAs crystal [13]. In this study, we investigated the dynamics of exciton-polaritons in GaAs thin films at various film thicknesses using a reflection-type pump-probe technique.…”
mentioning
confidence: 95%
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“…In the transientgrating and pump-probe signals under exciton resonant conditions, a slow rise of the signals much longer than the pulse width was observed in the negative-time region. [17][18][19] The propagation velocity estimated from the film thickness and the rise time Rise almost agrees with the group velocity of excitonic polaritons in a bulk GaAs crystal. 18,19) In this study, we investigated the dynamics of excitonpolaritons in GaAs thin films at various temperatures using reflection-type pump-probe techniques.…”
Section: Introductionsupporting
confidence: 56%