We report on the dependence of exciton‐polariton propagation on film thickness in GaAs thin films using a reflection‐type pump‐probe technique. The rise time of the transient signal under exciton excitation conditions increases with an increase in the film thickness. In order to reveal the origin of the change in signal rise time, we have compared the propagation velocities estimated from values of the signal rise time and effective film thickness with the calculated group velocity of the exciton‐polaritons in bulk GaAs crystals. The propagation velocities are almost consistent with the group velocity in the bulk crystals. Therefore, we conclude that the propagation of exciton‐polaritons in a confined system coincides with that in the bulk crystal (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)