2021 IEEE International Reliability Physics Symposium (IRPS) 2021
DOI: 10.1109/irps46558.2021.9405156
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Transient Investigation of Metal-oxide based, CMOS-compatible ECRAM

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Cited by 13 publications
(16 citation statements)
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“…A structure that efficiently generates heat and confines it in the ECRAM can promotes ion movement, resulting in faster switching speed. To date, physics-based modeling [ 42 ] has rarely been studied except for the equivalent circuit model [ 43 ]. A model that fits well with the experimental results will not only allow the design exploration of the synaptic devices for further improvement but also extrapolate the reliability perspective of ECRAMs.…”
Section: Discussionmentioning
confidence: 99%
“…A structure that efficiently generates heat and confines it in the ECRAM can promotes ion movement, resulting in faster switching speed. To date, physics-based modeling [ 42 ] has rarely been studied except for the equivalent circuit model [ 43 ]. A model that fits well with the experimental results will not only allow the design exploration of the synaptic devices for further improvement but also extrapolate the reliability perspective of ECRAMs.…”
Section: Discussionmentioning
confidence: 99%
“…Therefore, it is very difficult to uniformly control atomic-level changes in local filaments by applying identical voltage pulses. To solve this problem, three-terminal (3-T)-based electrochemical RAM (ECRAM) devices have been developed in which conductance is linearly changed by the bulk channel region. − In early ECRAM studies, channel conductivity was changed by using protons and lithium ions. − Excellent synaptic properties were achieved through facile ion migration based on a small ion mass. However, the main disadvantage is that conventional complementary metal–oxide–semiconductor (CMOS) processes cannot be used because a polymer- or lithium-ion-battery-based material is used as both the channel and electrolyte materials. , Moreover, because a battery stack is used as a memory device, lithium-ion-based ECRAM devices require a selector device because of open-circuit potentials …”
Section: Introductionmentioning
confidence: 99%
“…To overcome these limitations, oxygen-based ECRAM (O-ECRAM) devices are being studied as next-generation synaptic devices. − O-ECRAM devices have advantages such as CMOS compatibility and improved retention. Because RRAM-based materials are used as both electrolytes and channels in O-ECRAM devices, conventional CMOS processes can be utilized .…”
Section: Introductionmentioning
confidence: 99%
“…[ 32 ] In the latter case, the device conductance requires a certain time, called write‐read delay, to converge to a stable conductance state due to the redistribution of ions in the electrolyte. [ 16,33 ] It is believed that the ions migrating toward the channel will not completely transform into the non‐volatile conductance of EGT, and the diffusion of excess ions is the origin of the write‐read delay of EGT. [ 16,33 ] Compared with the high speed of ions under the high electric field generated by external voltage, the diffusion of ions under the internal electric field and concentration gradient features a significantly slower process.…”
Section: Introductionmentioning
confidence: 99%
“…[16,33] It is believed that the ions migrating toward the channel will not completely transform into the non-volatile conductance of EGT, and the diffusion of excess ions is the origin of the write-read delay of EGT. [16,33] Compared with the high speed of ions under the high electric field generated by external voltage, the diffusion of ions under the internal electric field and concentration gradient features a significantly slower process. [34,35] Since a stable conductance state is the prerequisite for hardware ANNs to perform vector-matrix multiplication, the write-read delay of EGTs will severely impact the acceleration performance of ANNs, although oxide-based EGTs have achieved write pulse widths of nanosecond.…”
Section: Introductionmentioning
confidence: 99%