Transformation of Radiation Induced Defect Centers as a Probe of Molecular Diffusion in a-SiO2

Pfeffer, Robert

doi:10.1007/978-1-4613-1031-0_23

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Transformation of Radiation Induced Defect Centers as a Probe of Molecular Diffusion in a-SiO2

Cited by 5 publications

References 11 publications

Cathodoluminescence Microcharacterisation of Silicon Dioxide Polymorphs

Cathodoluminescence Microcharacterisation of Silicon Dioxide Polymorphs

The Natures of Point Defects in Amorphous Silicon Dioxide

Magnetic resonance studies on radiation-induced point defects in mixed oxide glasses. II. Spin centers in alkali silicate glasses

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