Transceiver parameter detection using a high conversion gain RF amplitude detector

Bou-Sleiman, Sleiman; Ismail, Mohammed

doi:10.1109/iscas.2010.5537235

Cited by 13 publications

(14 citation statements)

References 12 publications

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“…The latter is easily digitized and ready for DSP processing. One class of feature translators is the RF amplitude detector, such as in [1] [2]. Signal amplitudes can show a direct or indirect correspondence to circuit parameters and as such can be deconstructed and interpreted to provide a reading on a desired metric or a comparison between iterative calibration searches.…”

Section: Rf Built-in-self-calibration Requirementsmentioning

confidence: 99%

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Enabling efficient built-in-self-calibration for RFICs

Bou-Sleiman

Ismail

2011

2011 18th IEEE International Conference on Electronics, Circuits, and Systems

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Robustness and yield enhancement techniques for RF circuits and systems are gaining accelerating traction due to increased PVT variability in nanometer CMOS. One of the more viable approaches that make use of the increasingly heterogeneous systems is digitally-assisted RF, enabling circuit programmability and flexibility. With the inclusion of the more robust digital, RF circuits' impairments may be successfully overcome or significantly diminished. This is enabled by implementing self-calibration mechanisms on top of self-test routines. In this paper, we highlight the basic requirements for enabling the on-chip self-calibration loop and discuss the main design steps. We also show an LNA circuit example demonstrating self-healing capabilities.

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Section: Rf Built-in-self-calibration Requirementsmentioning

confidence: 99%

“…Care should be taken however not to compress the LNA or the circuits following it. Therefore, self-test routines for linearity and compression points, such as in [2], can set the limits of the calibration. A 2.4GHz single-ended LNA based on [6] is implemented and shown in Fig.…”

Section: Formulate Calibration Algorithmsmentioning

confidence: 99%

Enabling efficient built-in-self-calibration for RFICs

Bou-Sleiman

Ismail

2011

2011 18th IEEE International Conference on Electronics, Circuits, and Systems

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“…The detector can be used to quantify a number of transceiver parameters such as gain, linearity, compression points, and even IQ mismatch -as presented in [10]. Since the detector is followed by an ADC, a quantized detector response can either be saved in a lookup table or fitted into an equation: possibly as a function of slope (-9V/V), mode (50mV shifts), or piecewise linear reconstruction to enable prediction of signal amplitude.…”

Section: Detector Usage In Bist and Biscmentioning

confidence: 99%

“…The IM3 amplitude can be extracted from the detector output by measuring the input and output of the LNA and comparing the latter with the expected output given no distortion (= input×predicted gain): the discrepancy between these two signals is attributed to the IM amplitude. It should be noted that in the case of two-tone tests, DC out becomes a lowfrequency oscillating signal whose mean is to be considered in the IM3 extraction [10]. The results of this sweep showing the actual and predicted values using the detector are shown in Fig.…”

Section: A Built-in-self-testmentioning

confidence: 99%

Millimeter-wave BiST and BiSC using a high-definition sub-ranged detector in 90nm CMOS

Bou-Sleiman

Akour

Khalil

et al. 2010

2010 53rd IEEE International Midwest Symposium on Circuits and Systems

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A wideband CMOS mm-Wave amplitude detector for on-chip self-test and calibration is presented. The highconversion-gain detector enables accurate on-chip amplitude measurements and allows for the prediction of key RF parameters. The detector operates across the 60GHz band and achieves a dynamic range of 0-0.5V and a sensitivity of -9V/V. The detector's practical use in mm-wave Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC) circuits is demonstrated using a 60 GHz CMOS LNA. Simulation results show that the LNA gain, compression point, and intermodulation distortion are predicted with minimal error. The detector and LNA are built in IBM's 90nm CMOS technology.

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“…However, these technologies are prone to higher process variations and defect rates, which makes RF BIST both more necessary and more challenging. Several techniques in the literature aim to reduce the dependence on external RF instrumentation for low cost testing [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18]. In [2][3][4], simple test signals such as multi-tone sinusoidal signals, are used to generate output data, where the performance of RF transceiver is predicted using the output data as well as machine learning methods.…”

Section: Introductionmentioning

confidence: 99%

Process independent gain measurement with low overhead via BIST/DUT co-design

Jeong

Kitchen

Ozev

2016

2016 IEEE 34th VLSI Test Symposium (VTS)

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Built-in Self-Test (BIST) is essential, particularly for radio frequency (RF) devices where off-chip RF signal analysis is costly or in some cases, infeasible. Two major problems have made RF BIST elusive. First, process variations make the BIST circuit behavior hard to predict, limiting accuracy of measurements. Second, the overhead, particularly in terms of performance degradation, make RF BIST undesirable. In this paper, we address these two issues for RF BIST gain measurement. First, we show that by setting up relative gain measurements and carefully crafting the BIST methodology and the matching BIST circuit, the effect of process variations on measurement accuracy can be suppressed. Second, by codesigning the BIST circuit together with the device under test (DUT), performance impact can be eliminated or significantly reduced. To demonstrate the proposed approach, we design a low noise amplifier (LNA) as the DUT together with the BIST circuit. We also design a stand-alone LNA with the same specifications and manufacture these two circuits on the same die. We show that the LNA gain can be determined very accurately, using only DC measurements, and the performance impact of the BIST circuit is negligible.

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Transceiver parameter detection using a high conversion gain RF amplitude detector

Cited by 13 publications

References 12 publications

Enabling efficient built-in-self-calibration for RFICs

Enabling efficient built-in-self-calibration for RFICs

Millimeter-wave BiST and BiSC using a high-definition sub-ranged detector in 90nm CMOS

Process independent gain measurement with low overhead via BIST/DUT co-design

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