Millimeter-wave BiST and BiSC using a high-definition sub-ranged detector in 90nm CMOS

A built in self test (BiST) system for a 60GHz phased array chip with high sensitivity large dynamic range detectors is presented. The system measures the array phase shifter relative step with an accuracy of 5deg and the gain of the TX and RX chain through loopback with an accuracy of +/-1dB across process, temperature, and voltage (PVT). The system is composed of an RF combining detector path between chains with switched coupling, low noise detectors based on self mixing, and bias circuits that compensate for temperature and process variation. The Detector off state load on the PA output is 0.2dB.

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“…3 shows different circuit configurations that were compared. Fig 3c shows the most common approach of a detector [4][5][6]. Figure 3.…”

Section: A Detector Designmentioning

confidence: 99%

“…In addition, building an accurate production testing environment at 60GHz is very expensive and is not acceptable for the mobile market. A promising direction of moving testing on-chip is emerging [4]. In this paper a new solution for phased array application is suggested.…”

Section: Introductionmentioning

confidence: 99%

High sensitivity detector with robust PVT performance for 60GHz BiST phased array systems in 90nm CMOS

Cohen

Israel

Degani

et al. 2012

2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems

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“…Consequently, for several years, new alternatives to microwave circuits testing approaches have been investigated, by means of DFT (Design For Test), BIST and alternate test methods [1]- [4].…”

Section: Introductionmentioning

confidence: 99%

Design of a K-band wideband controlled variable attenuator for microwave Built-In-Self-Test applications

Lahbib¹,

Descamps

Doukkali

et al. 2013

2013 13th Mediterranean Microwave Symposium (MMS)

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This paper presents a new microwave wideband controlled variable attenuator designed in a BiCMOS process. This variable attenuator is implanted as part of a microwave Built-In-Self-Test (BIST) circuit. The proposed BIST cell is dedicated for direct low cost measurement of the gain and the input 1dB compression point (CP1) of a K-band satellite reception chain (18.2 GHz-22 GHz). The simulation of the controlled variable attenuator with RLCk parasitic extraction shows that it can operate up to 100 GHz with a consumption of 4 mA, an area less than 0.009 mm 2 excluding pads and a gain range of 36 dB when the attenuator is alone and 17 dB when it is concatenated to the other blocks. This result was confirmed with the performed measurement on the BIST device. This BIST circuit gives new perspectives in term of test strategy, cost reduction and measurement accuracy for mm-wave integrated circuits.Index Terms -Microwave, BIST, controlled variable attenuator, K-band circuit, variable gain amplifier, test.

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“…In order to resolve theses challenges, increase the effectiveness and cost efficiency of analog and RF test in integrated systems, various test procedures have been proposed. Among these innovative analog/RF test solutions, onchip BiST technique is widely used for its low cost and nonintrusion [1] [2]. BiST solutions require the use of on chip miniature detectors which estimate the behavior of the circuit under test (CUT) in an easily test form.…”

Section: Introductionmentioning

confidence: 99%

“…BiST solutions require the use of on chip miniature detectors which estimate the behavior of the circuit under test (CUT) in an easily test form. The essential design characteristics for the detector are small area, low power, noninvasiveness, wide dynamic range and broadband operation [1].…”

Section: Introductionmentioning

confidence: 99%

A RF/DC current-mode detector for BiST and digital calibration of current-driven mixers

Lei

Yenamandra

Bibyk

et al. 2012

2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012)

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This paper presents a CMOS RF/DC current-mode detector as an essential requirement to realize Built-in Self Test (BiST) and calibration functionalities for current-mode based RFICs and demonstrates its application on the calibration of a current-driven passive mixer. A method is presented to extract test friendly DC features from the RF signal, without deteriorating the performance of test blocks in the transceiver. Simulation performance with IBM 90-nm process using 1.2 V power supply shows that the proposed detector is able to provide an RF to DC conversion gain of 35 mV/dB in a dynamic range of 25 dB from 900 MHz to 10 GHz. The current-mode detector is then applied in the IP2 digital calibration technique on the downconversion mixer under several corner conditions. Simulation results confirm the feasibility of the calibration as IIP2 improves more than 20 dBm.

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Millimeter-wave BiST and BiSC using a high-definition sub-ranged detector in 90nm CMOS

Cited by 13 publications

References 11 publications

High sensitivity detector with robust PVT performance for 60GHz BiST phased array systems in 90nm CMOS

High sensitivity detector with robust PVT performance for 60GHz BiST phased array systems in 90nm CMOS

Design of a K-band wideband controlled variable attenuator for microwave Built-In-Self-Test applications

A RF/DC current-mode detector for BiST and digital calibration of current-driven mixers

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