“…In such cases, DFT and BIST can be used to support on-line test during normal operation by detecting early reliability hazards and gaining in-sight about environmental conditions that can jeopardize the system's health [29,30,31,32,33,34,35,36,37,38,39,40,41]. They can also provide valuable feedback for achieving faulttolerance through calibration, tuning, or even reconfigurability [42,43,44,45,46]. Finally, DFT and BIST techniques can provide valuable feedback for diagnosis purposes [47,48,49,50,51,52,53,54,55,56,57,58,59].…”