Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

Ridler, N M; Clarke, Roland; Salter, M J; Wilson, Alan C.

doi:10.1109/arftg76.2010.5700046

Cited by 19 publications

(18 citation statements)

References 9 publications

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“…in terms of its S-parameters) [10]. Therefore, for the reasons given in [2,3], it has been decided not to use the LRL calibration technique with PIMMS at these higher millimeter-wave frequencies. Instead, a version of TRL has been developed that makes use of phase changes that are greater than those usually used with conventional TRL.…”

Section: Calibrationmentioning

confidence: 98%

“…The work described in this paper represents an extension of previous work in this area [2,3] and forms part of the on-going strategy to put in place primary national measurement capabilities for waveguide operating at millimeter-and submillimeter-wave frequencies (110 GHz to 1.1 THz). The paper describes the work that has been undertaken to extend the facilities to cover the 220 GHz to 330 GHz waveguide band (WR-03, [4]).…”

Section: Introductionmentioning

confidence: 98%

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Traceability to national standards for S-parameter measurements in waveguide at frequencies from 220 GHz to 330 GHz

Ridler

Clarke

Salter

et al. 2011

78th ARFTG Microwave Measurement Conference

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This paper describes a new facility that has been introduced recently to provide precision traceable scattering parameter measurements of waveguide devices in the frequency range 220 GHz to 330 GHz (i.e. in waveguide size WR-03). The facility comprises measurement instrumentation situated at the University of Leeds, UK, and associated primary reference standards provided by the National Physical Laboratory, UK. The instrumentation consists of a Vector Network Analyzer (VNA) and the standards are precision sections of waveguide that are used to calibrate the VNA. Traceability to national standards and the International System of units (SI) is achieved via precision dimensional measurements of the waveguide sections. Typical measurements, with uncertainties, are given to illustrate the current state-of-the-art for traceable measurements of this type.

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Section: Calibrationmentioning

confidence: 98%

Section: Introductionmentioning

confidence: 98%

Traceability to national standards for S-parameter measurements in waveguide at frequencies from 220 GHz to 330 GHz

Ridler

Clarke

Salter

et al. 2011

78th ARFTG Microwave Measurement Conference

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show abstract

“…The dimensional measurements provide traceability for the S-parameter measurements. Details of the traceability process for a VNA system in WR-05 waveguide have been given in [17]. The overall measurement setup (i.e., VNA, primary standards, standards' characterization procedures, and calibration routines) forms part of the UK's primary national standard system for S-parameter measurements [18,19].…”

Section: Vna Measurementsmentioning

confidence: 99%

Intercomparison of Terahertz Dielectric Measurements Using Vector Network Analyzer and Time-Domain Spectrometer

Naftaly

Shoaib

Stokes

et al. 2016

J Infrared Milli Terahz Waves

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We describe a method for direct intercomparison of terahertz permittivities at 200 GHz obtained by a Vector Network Analyzer and a Time-Domain Spectrometer, whereby both instruments operate in their customary configurations, i.e., the VNA in waveguide and TDS in free-space. The method employs material that can be inserted into a waveguide for VNA measurements or contained in a cell for TDS measurements. The intercomparison experiments were performed using two materials: petroleum jelly and a mixture of petroleum jelly with carbon powder. The obtained values of complex permittivities were similar within the measurement uncertainty. An intercomparison between VNA and TDS measurements is of importance because the two modalities are customarily employed separately and require different approaches. Since material permittivities can and have been measured using either platform, it is necessary to ascertain that the obtained data is similar in both cases.

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“…To establish the traceability, for any given measurement, it is necessary to use one or more reference standards in the calibration procedure which can be linked in some meaningful way to these base quantities. During the past decade, considerable progress has been made toward establishing traceability for VNA measurements above 100 GHz, for example [37][38][39]. Recently, these activities have extended to cover VNA metrology up to 1.1 THz [28,40].…”

Section: Verification and Traceabilitymentioning

confidence: 99%

Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

et al. 2017

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The two main modalities for making broadband phase-sensitive measurements at terahertz frequencies are Vector Network Analyzers (VNA) and Time Domain Spectrometers (TDS). These measuring instruments have separate and fundamentally different operating principles and methodologies, and they serve very different application spaces. The different architectures give rise to different measurement challenges and metrological solutions. This article reviews these two measurement techniques and discusses the different issues involved in making measurements using these systems. Calibration, verification and measurement traceability issues are reviewed, along with other major challenges facing these instrument architectures in the years to come. The differences in, and similarities between, the two measurement methods are discussed and analysed. Finally, the operating principles of ElectroOptic Sampling (EOS) are briefly discussed. This technique has some similarities to TDS and shares application space with the VNA.

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Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

Cited by 19 publications

References 9 publications

Traceability to national standards for S-parameter measurements in waveguide at frequencies from 220 GHz to 330 GHz

Traceability to national standards for S-parameter measurements in waveguide at frequencies from 220 GHz to 330 GHz

Intercomparison of Terahertz Dielectric Measurements Using Vector Network Analyzer and Time-Domain Spectrometer

Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

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