Towards automatic nanomanipulation: drift compensation in scanning probe microscopes

Mokaberi, Babak; Requicha, Ari

doi:10.1109/robot.2004.1307185

Cited by 38 publications

(35 citation statements)

References 9 publications

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“…Thermal drift is negligible at very low temperatures, and all experiments in atomic-precision manipulation to date have been done at extremely low temperatures (~ 4 K). The issue of thermal drift is addressed by Mokaberi and Requicha (2004) which highlights efforts towards automatic drift compensation through the use of Kalman filtering techniques.…”

Section: Nanomanipulation With the Spmmentioning

confidence: 99%

A review of research in the field of nanorobotics.

Sierra¹,

Weir²,

Jones³

2005

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This report highlights the findings of an extensive review of the literature in the area of nanorobotics. The main goal of this midyear LDRD effort is to survey and identify accomplishments and advancements that have been made in this relatively new and emerging field. As a result, it may be determined what routes in the area of nanorobotics are scientifically plausible and technically useful so that the Intelligent Systems and Robotics Center can position itself to play a role in the future development of nanotechnology. 4This page intentionally left blank 5

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Section: Nanomanipulation With the Spmmentioning

confidence: 99%

A review of research in the field of nanorobotics.

Sierra¹,

Weir²,

Jones³

2005

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“…For the estimation of the drift we will use Kalman filtering techniques similar to the localization approach used in mobile robot systems [14]. Requicha et al [13] already demon strated this approach in conjunction with an ambient temperature AFM. The CSV approach will provide the user with calibrated graphic overlays on real-world.…”

Section: Future Workmentioning

confidence: 99%

Towards automatic nanomanipulation at the atomic scale

Knepper¹,

Schütz²,

Zhang

et al. 2005

2005 IEEE International Conference on Robotics and Biomimetics - ROBIO

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Nanomanipulation using Atomic Force or Scanning Tunneling Microscopy (AFM, STM) has at tracted much attention among researchers in recent years. But even on an international scale, nanomanip ulation is operated mostly in manual mode. A scientist carefully carries out each individual move of the manip ulator tip in order to avoid a dead-end situation. The operator has to repeat similar tasks in the same tedious and error-prone way. If nanomanipulation is to come even close to fulfilling its scientific an economic poten tial, the bottleneck of manual operation must be elimi nated. This paper presents our activities and suggestions for automatic nanomanipulation on the atomic scale.

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“…AFM based nanomanipulations have been intensively studied in recent years [6][7][8][9][10][11][12][13][14] and various kinds of manipulation schemes have been proposed in last decade. Nowadays, manipulation of particles with diameters of ~10nm using AFM is being investigated by many research groups [14][15][16][17]. Nanomanipulation operations are routinely used to precisely control atoms, molecules or nanoscale objects to fabricate nanodevices and to repair or modify nanostructures formed by other methods.…”

Section: Introductionmentioning

confidence: 99%

Local scan for compensation of drift contamination in AFM based nanomanipulation

Wang

Liu

2009

2009 IEEE/RSJ International Conference on Intelligent Robots and Systems

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Because of the presence of thermal drift, AFM (atomic force microscopy) images are always contaminated. Such contamination is one of the major hampers to achieve accurate and efficient AFM based nanomanipulation. Based on contaminated images, the manipulation operations often fail. In this paper, we apply a local scan method to identify and compensate the thermal drift contamination in the AFM image. After an AFM image is captured, the entire image is divided into several parts along y direction. A local scan is immediately performed in each part of the image to calculate the drift value at that very part. In this manner, the drift value is calculated in a small local area instead of the global image. Thus, the drift can be more precisely estimated and the image can be more accurately recovered, which lead to improved accuracy for AFM imaging and enhanced productivity for AFM based nanomanipulation.

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Towards automatic nanomanipulation: drift compensation in scanning probe microscopes

Cited by 38 publications

References 9 publications

A review of research in the field of nanorobotics.

A review of research in the field of nanorobotics.

Towards automatic nanomanipulation at the atomic scale

Local scan for compensation of drift contamination in AFM based nanomanipulation

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