Total reflection X-ray fluorescence analysis using polycapillaries. A comparison with conventional setups

Sánchez, Héctor Jorge; Pérez, Roberto D.; Carvalho, Luísa; Rubio, Marcelo

doi:10.1016/j.nimb.2010.09.019

Cited by 3 publications

(2 citation statements)

References 9 publications

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“…Extreme short optical paths were realised as no monochromator was used and thus using the full polychromatic emission spectrum of this tube, extrapolated detection limits of 26 ng were achieved for cobalt. Sanchez et al 108 studied the use of a monolithic polycapillary half lens to produce a near parallel X-ray beam for TXRF experiments. Recorded spectra showed an excellent signal-to-noise ratio with a low background, but lack of intensity in the fluorescent signal.…”

Section: Txrfmentioning

confidence: 99%

Atomic spectrometry update-X-ray fluorescence spectrometry

West

Ellis

Potts

et al. 2011

J. Anal. At. Spectrom.

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Section: Txrfmentioning

confidence: 99%

Atomic spectrometry update-X-ray fluorescence spectrometry

West

Ellis

Potts

et al. 2011

J. Anal. At. Spectrom.

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“…Sanchez et al discussed the experimental setup of TXRF using polycapillary optics. Although applications of polycapillary optics have already been reported, the authors compared the analytical performance of the TXRF setups with a half polycapillary and beam guide optics, which were used for collimation of the primary X-rays in combination with a micro focus X-ray tube.…”

Section: Total Reflection X-ray Fluorescence Analysismentioning

confidence: 99%

X-ray Spectrometry

et al. 2011

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I n this Review, we focus on the most significant and essential progress in X-ray spectrometry (XRS) published during the period from January 2010 to August 2011 covering developments and improvements in X-ray optics, X-ray detectors, new quantification models in X-ray spectra and data evaluation, micro-X-ray fluorescence (micro-XRF) including 3D X-ray fluorescence (3D-XRF), elemental imaging techniques, electron probe microanalysis (EPMA), total reflection X-ray fluorescence (TXRF), particle-induced X-ray emission (PIXE) analysis, and X-ray absorption spectrometry (XAS). Herein, we focus on X-ray spectrometry, and thus, X-ray radiography used for only investigating inside structure images and X-ray diffraction (XRD) is not covered. However, we will introduce articles including combinations of these X-ray imaging techniques and other spectroscopic techniques. In addition, different applications in each subfield of XRS, including sample preparation, standard materials, energy-dispersive XRF (ED-XRF), and wavelength-dispersive XRF (WD-XRF), are described. We attempt to look over the current trends in this analytical field by critically citing selected papers to support the research activity of the community of X-ray scientists.Since the previous review on XRS in Analytical Chemistry, an international group of scientists published two overviews on XRS 1,2 in the Journal of Analytical Atomic Spectrometry covering the main fields of XRS analytical spectroscopic methods and instruments. These review articles involve all of the important sections of XRS in nine chapters: reviews, instrumentation, spectrum analysis, matrix correction and calibration, X-ray optics and micro fluorescence, synchrotron radiation (SR), TXRF, portable and mobile X-ray fluorescence (XRF), and online XRF and applications. The section on applications is categorized into geological and industrial minerals, environmental, archeological, cultural heritage, forensic science, etc. These review articles are useful, especially for an overall look at recent XRS research activities.The second edition of the book, "Elements of Modern X-ray Physics", was published. 3 It provides excellent explanations of the basics of X-ray physics, interactions with matter, X-ray sources,

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