2011
DOI: 10.1039/c1ja90038b
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Atomic spectrometry update-X-ray fluorescence spectrometry

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Cited by 45 publications
(34 citation statements)
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References 510 publications
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“…West et al provide a thorough review of advancements in these techniques as well as in X-ray optics and detectors. 117 …”
Section: X-ray Fluorescence (Xrf)mentioning
confidence: 99%
“…West et al provide a thorough review of advancements in these techniques as well as in X-ray optics and detectors. 117 …”
Section: X-ray Fluorescence (Xrf)mentioning
confidence: 99%
“…At present, the most relatively accessible techniques for surface analysis include X-ray photoelectron spectroscopy (XPS) (Batrusaitis et al, 2012), scanning electron microscopy combined with energy disperse spectroscopy (SEM/EDS) (Wang et al, 2010) and X-ray fluorescence spectroscopy (XFS) (Howard et al, 2012;West et al, 2011); although these methods are all capable of quantitative analysis of solid samples without the need for organic solvent, their sensitivities are rather low-on the order of a few percentage. Secondary ion mass spectrometry (SIMS), on the other hand, has high sensitivity and detection limits that can reach the level of parts per billion (Gannoun et al, 2011;Cerqueira et al, 2011).…”
Section: Introductionmentioning
confidence: 99%
“…Surface analysis techniques, which are applied widely in material analysis, appear to be promising analytical routes because they require almost no solvent during the entire analysis procedure. At present, the most relatively accessible techniques for surface analysis include X-ray photoelectron spectroscopy (XPS), 9 scanning electron microscopy combined with energy disperse spectroscopy (SEM/EDS), 10 and X-ray fluorescence spectroscopy (XFS); 11,12 although these methods are all capable of quantitative analysis of solid samples without the need for organic solvent, their sensitivities are rather low-on the order of a few percentage. Secondary ion mass spectrometry (SIMS), on the other hand, has high sensitivity and detec-tion limits that can reach the level of parts per billion.…”
Section: Introductionmentioning
confidence: 99%