Total ionizing dose effects on flash-based field programmable gate array

New Reprogrammable and Non-Volatile Radiation-Tolerant FPGA: RT ProASIC®3

“…TID irradiation tests for the selected features were performed in x-rays and in gamma-rays. Most of the results presented in this chapter are obtained in x-rays beams whose effects are estimated to be approximately 2.9 times less effective than those measured in Gamma rays [Wang et al, 2004]. This calibration factor between the x-rays and the Gamma-ray data was calculated experimentally using the same methodology previously applied in [Palkuti & LePage, 1982].…”

“…Three radiation-induced mechanisms detailed in [Wang et al, 2004, Brown & Brewer, 2002 can affect the threshold voltage of the FG devices: 1) holes injected into the FG, 2) holes trapped into the oxides and 3) electrons emitted over the polysilicon/oxide barriers. Electron-hole pairs initiated from radiation test results in the injection of holes in the FG and the trapping of holes in the oxides.…”

“…As explained in [Wang et al, 2004, the percentage of the degradation in the propagation delay is mainly due to the charge loss in the FG devices (whether in the erase or the program state). Therefore, a first TID mitigation solution would be to attempt to restore t h a t c h a r g e t o t h e s e F G c e l l s .…”

“…However, despite the SEE immunity of their configuration memory, their Floating Gate (FG) switches and CMOS logic gates are susceptible to both effects of the Total Ioninzing Dose (TID) and the Single Event Effects (SEE). For TID effects, the primary issue is the radiation-induced charge loss in the floating gate [Snyder et al, 1989, Cellere et al, 2004, Wang et al, 2004, Guertin et al, 2006, resulting in the change of the FPGA electrical performances (maximum speed, current, etc.). While for SEE, the primary concern resides in the upset of its registers (state of the flip-flop) due to a particle hit, resulting in the disruption of the normal operation of the FPGA-design [Rezgui et al, 2007a[Rezgui et al, & 2007b.…”

Accurate analysis of SET effects on Flash-based FPGA System-on-a-Chip for satellite applications

“…Previous studies focus on the nature of these events. New insight on flash-based FPGA is investigated in [4]. A new methodology for effectively measuring the width of radiation-induced transient faults has been proposed in [5] [6].…”