Total external reflection of X-rays from solid surfaces

Стожаров, В. М.

doi:10.1134/s1063784217010224

Cited by 6 publications

(8 citation statements)

References 7 publications

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“…Whereas the first maximum is located around 10 00 for each sample, the second maximum depends on the porosification parameters, both in terms of intensity and position. The decrease of the refraction intensity can be attributed to a decrease of the volume density of scattering atoms from where X-ray TER takes place (Stozharov, 2017;Stozharov & Pronin, 2017). The critical angle of the pSi c is positioned at 576, 556, 533 and 509 00 , respectively, for S1, S2, S3 and S4, and depends on the electron density near the surface (Tolan & Press, 1998).…”

Section: Research Papersmentioning

confidence: 99%

X-ray scattering profiles: revealing the porosity gradient in porous silicon

et al. 2021

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Porous silicon layers with different porosities were prepared by adjusting the anodization current density of the electrochemical etching process, starting from highly doped p-type crystalline silicon wafers. The microstructural parameters of the porous layers were assessed by high-resolution X-ray diffraction, total external reflection, scanning electron microscopy and nitrogen adsorption–desorption analysis. Furthermore, both the surface porosity and the mean porosity for the entire volume of the samples were estimated by employing total external reflection measurements and X-ray reciprocal-space mapping, respectively. The results clearly indicate that the surface porosity is different from the mean porosity, and the presence of a depth porosity gradient is suggested. To evaluate the porosity gradient in a nondestructive way, a new laboratory method using the grazing-incidence X-ray diffraction technique is reported. It is based on the analysis of the X-ray scattering profiles of the porous layers to obtain the static Debye–Waller factors. In this way, a description of the porosity gradient in a quantitative framework becomes possible, and, as a result, it was shown that the porosity increases exponentially with the X-ray penetration depth. Moreover, a strong dependence between the porosity gradient and the anodization current was demonstrated. Thus, in the case of the lowest anodization current (e.g. 50 mA cm−2) a variation of only 15% of the porosity from the surface to the interface is found, but when applying a high anodization current of 110 mA cm−2 the porosity close to the bulk interface is almost three times higher than at the surface.

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Section: Research Papersmentioning

confidence: 99%

X-ray scattering profiles: revealing the porosity gradient in porous silicon

et al. 2021

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“…The main results of these studies were two effects: firstly, the refractive index of X-rays found in solids is less than one and, secondly, the small depths of the formation TER of the X-ray in various substances from units to hundreds of angstroms (Å). The surface character TER of the X-ray, which provides a reflection coefficient close to one, is used in practice to create a paraxial beam with low divergence, on the basis of which X-ray fluorescence analysis with high sensitivity up to 10 −10 g [17] and the study of the properties TER of the X-ray [18] is carried out.…”

Section: Introductionmentioning

confidence: 99%

“…In [18], a comprehensive study of X-ray reflection was carried out, including measurements of radiographs TER and X-ray diffraction. For this purpose, a standard DRON-7 diffractometer was used, manufactured at the St. Petersburg industrial enterprise "Burevestnik", with the minimum possible step in the X-ray scattering angle ∆(2θ) = 0.001 • = 3.6 .…”

Section: Introductionmentioning

confidence: 99%

“…However, in most works on the total external reflection of X-rays from s graphs are integral curves in the form of quasi-step functions, the greatest slo corresponds sliding angle α TER of the X-ray, which determines the refractiv rays in solids [15,16,19]. Since in our works radiographs of X-ray differ from ones, a methodical experiment was undertaken on a single crystal of silicon ( to compare the integral curve of TER with the curves of TER with maxima ob work [18]. The integral curve of the TER was obtained without a parabolic mir a collimator and a Soller slit in the "θ" mode, characterized by scanning the s the angle θ with a stationary detector.…”

Section: Introductionmentioning

confidence: 99%

“…In Figure 1, a comparison of the integ TER with the curve of TER, characterized by a maximum, shows the coinci maximum with the section of the integral curve of TER with the greatest slop TER curves with a maximum can be called differential TER curve. For quantitative interpretation of abnormal radiographs TER polished tantalum, shown in Figure 2, we should consider the principles of refraction of X-rays in solids [18]:…”

Section: Introductionmentioning

confidence: 99%

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Surface Plasmons Excited by X-rays in the Surface Layers of Solids

Стожаров¹

2022

Solids

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The phenomenon of total external reflection of X-rays at a sliding angle of incidence of a beam of incident X-rays is investigated. For metals, a quantitative law of direct dependence of the refractive index decrement on the interplane distance is obtained. The excitation of surface plasmons by X-rays that have experienced complete external reflection is detected. For surface plasmons, a dimensional effect was observed, expressed in an increase in the energy of plasmons and the concentration of conduction electrons with an increase in the depth of the output of surface plasmons. By the method of dispersion of surface plasmons, internal mechanical micro-stresses and spontaneous polarization of the surface layers of glassy dielectrics and in thin layers of vanadium dioxide were determined. The absence of micro-stresses in the lithium fluoride ionic single crystal was found out, and the polarization observed in it is due to the large dipole moment of the molecules of this crystal. In thin films of vanadium dioxide, the dependence of micro-stresses on the stresses in the substrates was found.

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Total External Reflection of X Rays from Polycrystal Solid Surface

Стожаров

Pronin

2017

Tech. Phys.

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Total external reflection of X-rays from solid surfaces

Cited by 6 publications

References 7 publications

X-ray scattering profiles: revealing the porosity gradient in porous silicon

X-ray scattering profiles: revealing the porosity gradient in porous silicon

Surface Plasmons Excited by X-rays in the Surface Layers of Solids

Total External Reflection of X Rays from Polycrystal Solid Surface

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