Total dose bias dependency and ELDRS effects in bipolar linear devices

Abstract

Total dose tests of several bipolar linear devices show sensitivity to both dose rate and bias during exposure. All devices exhibited Enhanced Low Dose Rate Sensitivity (ELDRS). An accelerated ELDRS test method for three different devices demonstrate results similar to tests at low dose rate. Behavior and critical parameters from these tests are compared and discussed.

Total Ionizing Dose and Dose Rate Effects in Candidate Spacecraft Electronic Devices

“…The detailed test results for two device types, LM139 and LM124, that were particularly sensitive to dose rate effects are presented in Figure 1 and Figure 2. As expected from previous reports [1][2][3][4][5][6], many devices exhibited some degree of sensitivity to dose rate effects. In most of cases, however, this sensitivity was not significant enough to have major practical impact for many typical spacecraft applications.…”

Bias effects on total dose-induced degradation of bipolar linear microcircuits for switched dose-rate irradiation

“…Such a result is not surprising since the mechanisms at play at LDR and HDR are not the same [15]. Similar results were also reported in the literature [9][10][11], showing that experimental dose sensitivity evaluation should be performed using the bias conditions corresponding to the on-flight application.…”

“…Although it is generally assumed that irradiation with all pins grounded corresponds to the worst case, it has been shown that this is not always the case [10][11][12][13].…”

The enhanced low dose rate sensitivity of a linear voltage regulator with different biases

“…Moreover, the enhanced low dose rate sensitivity (ELDRS), which results in enhanced degradation of bipolar linear integrated circuits when irradiated at low dose rates, has been reported extensively in Refs. [1][2][3]. In addition, testing of some linear voltage regulators shows that they exhibit both an ELDRS effect and bias dependency OE1 4 , but there is little in the literature that discusses the relation between biases and the ELDRS effect.…”