Organic–inorganic
hybrid perovskite thin films with nanostructured
polycrystalline grains have shown great potential in various nanoscale
optoelectrical applications. Among them, the field of electrical memory has fallen behind due to insufficient
knowledge of the related resistive switching characters and mechanisms.
In the present work, switching behaviors of perovskite memory devices
are systematically analyzed by comparing them with organic memory
devices. We found that decreasing the conductivity of a polycrystalline
perovskite thin layer would lead to unipolar switching behaviors,
which is supplementary to the present perovskite memory family where
bipolar switching is commonly reported. Moreover, our proposed symmetrical
device with a nanoscale heterolayer structure enables us not only
to achieve highly reproducible unipolar switching devices but also
to settle the argument whether microconducting channels exist within
perovskite memory devices through characterizing the microscopic morphological
homogeneity. Surprisingly, the scanning electron microscopy results
show that partial 10 μm large perovskite grains would be decomposed
into various 100 nm small grains under high external bias, indicating
the presence of microconducting channels. Furthermore, energy-dispersive
X-ray spectroscopy results together with photoluminescence results
of the perovskite thin film before and after applying bias are nearly
identical, demonstrating that microconducting channels are formed
without any difference in compositions or optical properties. Our
discoveries provide a practical strategy to achieve electrical storage
via organic–inorganic hybrid perovskite thin-film devices.