2006
DOI: 10.1007/s10853-006-0844-7
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Titanium-doped indium oxide films prepared by d.c. magnetron sputtering using ceramic target

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Cited by 39 publications
(23 citation statements)
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“…From the previous discussion, the enhancemento ft he photoelectrochemical response upon doping cannot be explained solely by an increase in N A .I ts eems that there is also ac ontribution that comesf rom ah igherh ole mobility.T he increaseo f m with the dopantc oncentration was reported forI n 2 O 3 with severalm etal dopants (such as W, Mo, and Ti) [55][56][57] and for the perovskite SrTiO 3 doped with La, [58] which was linked to lattice distortion triggered by doping. Severalr eports pointedo ut www.chemsuschem.org av ariation of the unit cell parameters of the LaFeO 3 perovskite structure with the introduction of divalent Zn and Mg ions.…”
Section: Photoelectrochemical Characterizationmentioning
confidence: 98%
“…From the previous discussion, the enhancemento ft he photoelectrochemical response upon doping cannot be explained solely by an increase in N A .I ts eems that there is also ac ontribution that comesf rom ah igherh ole mobility.T he increaseo f m with the dopantc oncentration was reported forI n 2 O 3 with severalm etal dopants (such as W, Mo, and Ti) [55][56][57] and for the perovskite SrTiO 3 doped with La, [58] which was linked to lattice distortion triggered by doping. Severalr eports pointedo ut www.chemsuschem.org av ariation of the unit cell parameters of the LaFeO 3 perovskite structure with the introduction of divalent Zn and Mg ions.…”
Section: Photoelectrochemical Characterizationmentioning
confidence: 98%
“…Therefore, the electrical and optical properties of ITiO thin film should be studied in order to investigate the possible application of the film as a transparent conducting electrode for DSCs and other electrooptical devices. However, only a few papers on the growth of the ITiO thin film were studied systematically and published [3][4][5].…”
Section: Introductionmentioning
confidence: 99%
“…Those values are in agreement with those already reported for films prepared by several techniques. Typical resistivities in the 10 −4 Ω cm range have been obtained by Gupta et al 6 for film deposited by PLD from 5 wt.% Ti targets; Sung and Han 7 have reported a resistivity of 1.4 × 10 −3 Ω cm for films prepared by magnetic null discharge sputtering using a target sintered with 90 wt.% In 2 O 3 and 10 wt.% TiO 2 concentration and, on the other hand, van Hest et al 4 and Abe and Ishiyama 12 have given an account of a minimum of the resistivity depending on the actual film Ti content, being ∼1 × 10 −4 Ω cm for films with 3 at.% Ti content. Regarding the limit of resistivity pointed out by Bellingham et al 13, it should be noted that in the hypothesis that a carrier concentration of 2.1 × 10 −27 m −3 is obtained by the whole In 3+ substitution by Ti 4+ in the Ti(6.6%):In 2 O 3 sample, resistivity values show excellent results.…”
Section: Resultsmentioning
confidence: 85%