2017
DOI: 10.1080/09506608.2016.1270728
|View full text |Cite
|
Sign up to set email alerts
|

Three-dimensional nanoscale characterisation of materials by atom probe tomography

Abstract: The development of three-dimensional (3-D), characterisation techniques with high spatial and mass resolution is crucial for understanding and developing advanced materials for many engineering applications as well as for understanding natural materials. In recent decades, atom probe tomography (APT), which combines a point projection microscope and time-offlight mass spectrometer, has evolved to be an excellent characterisation technique capable of providing 3-D nanoscale characterisation of materials with su… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
88
0

Year Published

2017
2017
2023
2023

Publication Types

Select...
8
1

Relationship

2
7

Authors

Journals

citations
Cited by 136 publications
(88 citation statements)
references
References 266 publications
(469 reference statements)
0
88
0
Order By: Relevance
“…However, some length-scale challenges can be addressed by employing state-of-theart techniques such as atom probe tomography (APT) [183], high-resolution transmission electron microscopy (HRTEM), and high-angle annular dark-field imaging in scanning transmission electron microscope mode (HAADF-STEM). The use of complementary APT experimental techniques such as APT with HAADF-STEM can provide a combination of nano-scale compositional and structural information that one technique alone cannot provide possibly leading to greater scientific understanding [184].…”
Section: Discussionmentioning
confidence: 99%
“…However, some length-scale challenges can be addressed by employing state-of-theart techniques such as atom probe tomography (APT) [183], high-resolution transmission electron microscopy (HRTEM), and high-angle annular dark-field imaging in scanning transmission electron microscope mode (HAADF-STEM). The use of complementary APT experimental techniques such as APT with HAADF-STEM can provide a combination of nano-scale compositional and structural information that one technique alone cannot provide possibly leading to greater scientific understanding [184].…”
Section: Discussionmentioning
confidence: 99%
“…Two characterization techniques that provide high spatial resolution information are Atom Probe Tomography (APT) and Scanning Transmission X‐ray Microscopy (STXM) . APT is a single atom 3‐D microscopy that is able to reconstruct the 3‐D position and chemical identity of all atoms with sub‐nanometer resolution from a needle shaped specimen with dimensions of tens to hundreds of nanometers, making it the highest resolution technique to provide 3‐D elemental identification ,,. STXM relies on a zone plate to focus soft X‐rays emitted by a synchrotron onto a small spot on the sample, through which the sample is scanned, and by measuring the total transmitted intensity of the beam as a function of energy it can give information about local chemical environment and abundance.…”
Section: Introductionmentioning
confidence: 99%
“…is more difficult to quantitatively analyze with TEM-EDS or electron energy loss spectroscopy (EELS) [28][29][30]. The full range of techniques can be used to examine material before and different material after cycling as shown for STXM and XANES data in Fig.…”
Section: Example Measurementsmentioning
confidence: 99%