2013
DOI: 10.1117/12.2017958
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Thin-film, wide-angle, design-tunable, selective absorber from near UV to far infrared

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Cited by 11 publications
(12 citation statements)
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“…These identifications were determined from the graphical intersection of the refractive index spectrum (λ) for SiO 2 and the linear curve for n(λ) given by Eqs. (4)-(6), as was done in [21]. Figure 2(c)-(d) compares the analytically and numerically calculated resonance wavelengths.…”
Section: Resultsmentioning
confidence: 94%
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“…These identifications were determined from the graphical intersection of the refractive index spectrum (λ) for SiO 2 and the linear curve for n(λ) given by Eqs. (4)-(6), as was done in [21]. Figure 2(c)-(d) compares the analytically and numerically calculated resonance wavelengths.…”
Section: Resultsmentioning
confidence: 94%
“…We present results for a far-IR absorber with a surface pattern comprising a periodic pattern of squares, which follows known near- [18,19], and mid-IR designs [20].There are few prior reports of periodic square (or rectangular patterns)designed for far-IR absorption beyond ~10 micron wavelengths [14,21].We observe multiple absorption bands, which are attributed to fundamental and harmonic resonances. Up to 95% absorption was achieved in the fundamental band at 53.5μm wavelength.…”
Section: Introductionmentioning
confidence: 87%
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“…Independence on polarization and incidence angle have been demonstrated [11][12][13][14][15] . *janardan..nath@knights.ucf.edu Structured thin-film absorbers typically comprise 3 layers, namely a top surface metal with sub-wavelength patterning, a dielectric spacer, and a metal ground plane on suitable substrate [3][4][5][6][7][8][9][10][11][12][13][14][15] . Patterning is usually periodic and unit cells can have various geometries, e.g.…”
Section: Introductionmentioning
confidence: 99%